Yeeun Park

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Inspection system including reference specimen and method of formin...
- Patent number 11,921,270
- Issue date Mar 5, 2024
- Samsung Electronics Co., Ltd.
- Sungil Choi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF OPTICAL MEASUREMENT OF NUMERICAL APERTURE OF O...
- Publication number 20250060276
- Publication date Feb 20, 2025
- Samsung Electronics Co., Ltd.
- Yeeun Park
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM INCLUDING REFERENCE SPECIMEN AND METHOD OF FORMIN...
- Publication number 20230008686
- Publication date Jan 12, 2023
- Samsung Electronics Co., Ltd.
- Sungil Choi
- G01 - MEASURING TESTING