Yefim-Haim Fefer

Person

Petah-Tikva, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Connection quality verification for integrated circuit test
- Patent number 9,097,758
- Issue date Aug 4, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Yefim-Haim Fefer
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device, calibration module, and method therefor
- Patent number 8,896,341
- Issue date Nov 25, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Sergey Sofer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated circuit and integrated circuit package
- Patent number 8,737,029
- Issue date May 27, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Sergey Sofer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit die, an integrated circuit package and a method...
- Patent number 8,531,197
- Issue date Sep 10, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Yefim-Haim Fefer
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a variable digital delay line and a device havin...
- Patent number 8,368,383
- Issue date Feb 5, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Yefim-Haim Fefer
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for adjusting an impedance of an output driver of...
- Patent number 7,969,181
- Issue date Jun 28, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Yefim Fefer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device and method for compensating for ground voltage elevations
- Patent number 7,741,826
- Issue date Jun 22, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Yefim Fefer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT DEVICE, CALIBRATION MODULE, AND METHOD THEREFOR
- Publication number 20130038373
- Publication date Feb 14, 2013
- Freescale Semiconductor , Inc.
- Sergey Sofer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEVICE AND METHOD FOR COMPENSATING FOR VOLTAGE DROPS
- Publication number 20120169411
- Publication date Jul 5, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Yefim-Haim Fefer
- G05 - CONTROLLING REGULATING
Information Patent Application
INTEGRATED CIRCUIT AND INTEGRATED CIRCUIT PACKAGE
- Publication number 20120050926
- Publication date Mar 1, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Sergey Sofer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONNECTION QUALITY VERIFICATION FOR INTEGRATED CIRCUIT TEST
- Publication number 20120038367
- Publication date Feb 16, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Yefim-Haim Fefer
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DIE, AN INTEGRATED CIRCUIT PACKAGE AND A METHOD...
- Publication number 20110121818
- Publication date May 26, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Yefim-Haim Fefer
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A VARIABLE DIGITAL DELAY LINE AND A DEVICE HAVIN...
- Publication number 20100072979
- Publication date Mar 25, 2010
- Freescale Semiconductor,Inc
- Yefim-Haim Fefer
- G01 - MEASURING TESTING

Yefim-Haim Fefer

Person

Patents Grantslast 30 patents

Connection quality verification for integrated circuit test

Integrated circuit device, calibration module, and method therefor

Integrated circuit and integrated circuit package

Integrated circuit die, an integrated circuit package and a method...

Method for testing a variable digital delay line and a device havin...

Device and method for adjusting an impedance of an output driver of...

Device and method for compensating for ground voltage elevations

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT DEVICE, CALIBRATION MODULE, AND METHOD THEREFOR

DEVICE AND METHOD FOR COMPENSATING FOR VOLTAGE DROPS

INTEGRATED CIRCUIT AND INTEGRATED CIRCUIT PACKAGE

CONNECTION QUALITY VERIFICATION FOR INTEGRATED CIRCUIT TEST

INTEGRATED CIRCUIT DIE, AN INTEGRATED CIRCUIT PACKAGE AND A METHOD...

METHOD FOR TESTING A VARIABLE DIGITAL DELAY LINE AND A DEVICE HAVIN...