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Yehiel Shilo
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Jerusalem, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Offline sensor calibration
Patent number
11,112,283
Issue date
Sep 7, 2021
Intel Corporation
Lev Y. Lavy
G01 - MEASURING TESTING
Information
Patent Grant
Sensor signal reconstruction in a sensor hub
Patent number
10,912,494
Issue date
Feb 9, 2021
Intel Corporation
Ke Han
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Testing of device sensors on a manufacturing line
Patent number
10,677,618
Issue date
Jun 9, 2020
Intel Corporation
Yael Yanai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SENSOR SIGNAL RECONSTRUCTION IN A SENSOR HUB
Publication number
20180353106
Publication date
Dec 13, 2018
Intel Corporation
Ke HAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OFFLINE SENSOR CALIBRATION
Publication number
20180299302
Publication date
Oct 18, 2018
Intel Corporation
Lev Y. Lavy
G01 - MEASURING TESTING
Information
Patent Application
TESTING OF DEVICE SENSORS ON A MANUFACTURING LINE
Publication number
20170254683
Publication date
Sep 7, 2017
Intel Corporation
Yael Yanai
G01 - MEASURING TESTING