YEHIM-HAIM FEFER

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PETAH-TIKVA, IL

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for compensating for voltage drops
- Patent number 9,086,712
- Issue date Jul 21, 2015
- Freesacle Semiconductor, Inc.
- Yehim-Haim Fefer
- G05 - CONTROLLING REGULATING
Information Patent Grant
Device and method for compensating for voltage drops
- Patent number 8,836,414
- Issue date Sep 16, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Yehim-Haim Fefer
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for testing noise immunity of an integrated circuit and a de...
- Patent number 8,134,384
- Issue date Mar 13, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Yoav Weizman
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for compensating for voltage drops
- Patent number 7,956,594
- Issue date Jun 7, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Sergey Sofer
- G05 - CONTROLLING REGULATING
Information Patent Grant
Device and method for testing a noise immunity characteristic of an...
- Patent number 7,932,731
- Issue date Apr 26, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Sergey Sofer
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for evaluating electrostatic discharge protection...
- Patent number 7,928,753
- Issue date Apr 19, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Yehim-Haim Fefer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR COMPENSATING FOR VOLTAGE DROPS
- Publication number 20150002218
- Publication date Jan 1, 2015
- FREESCALE SEMICONDUCTOR, INC.
- YEHIM-HAIM FEFER
- G05 - CONTROLLING REGULATING
Information Patent Application
DEVICE AND METHOD FOR EVALUATING ELECTROSTATIC DISCHARGE PROTECTION...
- Publication number 20100225346
- Publication date Sep 9, 2010
- Freescale Semiconductor
- Yehim-Haim Fefer
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING NOISE IMMUNITY OF AN INTEGRATED CIRCUIT AND A DE...
- Publication number 20100001755
- Publication date Jan 7, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Yoav Weizman
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TESTING A NOISE IMMUNITY CHARACTERISTIC OF AN...
- Publication number 20090134883
- Publication date May 28, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Sergey Sofer
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for Compensating for Voltage Drops
- Publication number 20080224684
- Publication date Sep 18, 2008
- Freescale Semiconductor Inc.
- Sergey Sofer
- G05 - CONTROLLING REGULATING