Yehonatan Hai OFIR

Follow

Person

Rehovot, IL

People

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS
- Publication number 20240338811
- Publication date Oct 10, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehonatan Hai OFIR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT EXAMINATION ON A SEMICONDUCTOR SPECIMEN
- Publication number 20240078659
- Publication date Mar 7, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehonatan Hai OFIR
- G06 - COMPUTING CALCULATING COUNTING