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Yehuda Cohen
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Moshav Timorim, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Reconstruction of a distorted image of an array of structural eleme...
Patent number
11,798,138
Issue date
Oct 24, 2023
Applied Materials Israel Ltd.
Yehuda Cohen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Identification of an array in a semiconductor specimen
Patent number
11,645,831
Issue date
May 9, 2023
Applied Materials Israel Ltd.
Yehuda Cohen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System, method and computer program product for defect detection ba...
Patent number
9,767,356
Issue date
Sep 19, 2017
Applied Materials Israel Ltd.
Moshe Amzaleg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method, system, and computer program product for detection of defec...
Patent number
9,558,548
Issue date
Jan 31, 2017
Applied Materials Israel Ltd.
Moshe Amzaleg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System, method and computer program product for defect detection ba...
Patent number
9,070,014
Issue date
Jun 30, 2015
Applied Materials Israel, Ltd.
Moshe Amzaleg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method, system, and computer program product for detection of defec...
Patent number
9,070,180
Issue date
Jun 30, 2015
Applied Materials Israel, Ltd.
Moshe Amzaleg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
High throughput across-wafer-variation mapping
Patent number
7,990,546
Issue date
Aug 2, 2011
Applied Materials Israel, Ltd.
Jeong Ho Yeo
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting defects
Patent number
7,379,580
Issue date
May 27, 2008
Applied Materials, Inc.
Evgeni Levin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for detecting defects
Patent number
6,829,381
Issue date
Dec 7, 2004
Applied Materials, Inc.
Evgeni Levin
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
RECONSTRUCTION OF A DISTORTED IMAGE OF AN ARRAY OF STRUCTURAL ELEME...
Publication number
20230419456
Publication date
Dec 28, 2023
APPLIED MATERIALS ISRAEL LTD.
Yehuda Cohen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IDENTIFICATION OF AN ARRAY IN A SEMICONDUCTOR SPECIMEN
Publication number
20230230349
Publication date
Jul 20, 2023
APPLIED MATERIALS ISRAEL LTD.
Yehuda COHEN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RECONSTRUCTION OF A DISTORTED IMAGE OF AN ARRAY OF STRUCTURAL ELEME...
Publication number
20220012852
Publication date
Jan 13, 2022
APPLIED MATERIALS ISRAEL LTD.
Yehuda COHEN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IDENTIFICATION OF AN ARRAY IN A SEMICONDUCTOR SPECIMEN
Publication number
20220012861
Publication date
Jan 13, 2022
APPLIED MATERIALS ISRAEL LTD.
Yehuda COHEN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR DETECTION OF DEFEC...
Publication number
20150287178
Publication date
Oct 8, 2015
APPLIED MATERIALS ISRAEL LTD.
Moshe Amzaleg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION BA...
Publication number
20150278597
Publication date
Oct 1, 2015
APPLIED MATERIALS ISRAEL LTD.
Moshe Amzaleg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR DETECTION OF DEFEC...
Publication number
20140233838
Publication date
Aug 21, 2014
APPLIED MATERIALS ISRAEL LTD.
Moshe Amzaleg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION BA...
Publication number
20140233844
Publication date
Aug 21, 2014
APPLIED MATERIALS ISRAEL LTD.
Moshe Amzaleg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HIGH THROUGHPUT ACROSS-WAFER-VARIATION MAPPING
Publication number
20090021749
Publication date
Jan 22, 2009
Jeong Ho Yeo
G01 - MEASURING TESTING
Information
Patent Application
Method for detecting defects
Publication number
20050013475
Publication date
Jan 20, 2005
Applied Materials, Inc.
Evgeni Levin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for detecting defects
Publication number
20030099392
Publication date
May 29, 2003
Evgeni Levin
G06 - COMPUTING CALCULATING COUNTING