Yehuda Yavets-Chen

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Kfar Vitkin, IL

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Patents Grantslast 30 patents

Information Patent Grant
Sample analysis system and method
- Patent number 11,061,045
- Issue date Jul 13, 2021
- Picodya Technologies Ltd.
- Yehuda Yavets-Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BLISTER PACK AND BLISTER PACK HOLDER
- Publication number 20230051725
- Publication date Feb 16, 2023
- Picodya Technologies Ltd.
- Yehuda YAVETS-CHEN
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
MATRIX DROPLET EXTRUDER, SAMPLE HOLDER AND SAMPLE ANALYSIS SYSTEM
- Publication number 20220146542
- Publication date May 12, 2022
- Picodya Technologies Ltd.
- Yehuda YAVETS-CHEN
- G01 - MEASURING TESTING