Yehuda Zur

Person

Tel-Aviv, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Analyzing a sidewall of hole milled in a sample to determine thickn...
- Patent number 12,033,831
- Issue date Jul 9, 2024
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced charging by low negative voltage in FIB systems
- Patent number 11,887,810
- Issue date Jan 30, 2024
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FIB delayering endpoint detection by monitoring sputtered materials...
- Patent number 11,694,934
- Issue date Jul 4, 2023
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Uniform milling of adjacent materials using parallel scanning fib
- Patent number 11,636,997
- Issue date Apr 25, 2023
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Back-scatter electrons (BSE) imaging with a SEM in tilted mode usin...
- Patent number 11,626,267
- Issue date Apr 11, 2023
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzing a buried layer of a sample
- Patent number 11,598,633
- Issue date Mar 7, 2023
- Applied Materials Israel Ltd.
- Alexander Mairov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SNR for x-ray detectors in SEM systems by using polarization filter
- Patent number 11,525,791
- Issue date Dec 13, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray imaging in cross-section using un-cut lamella with background...
- Patent number 11,501,951
- Issue date Nov 15, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution x-ray spectroscopy surface material analysis
- Patent number 11,404,244
- Issue date Aug 2, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive geometry for optimal focused ion beam etching
- Patent number 11,315,754
- Issue date Apr 26, 2022
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holes tilt angle measurement using FIB diagonal cut
- Patent number 11,280,749
- Issue date Mar 22, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Forming a vertical surface
- Patent number 11,276,557
- Issue date Mar 15, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
End-point detection for similar adjacent materials
- Patent number 11,199,401
- Issue date Dec 14, 2021
- Applied Materials Israel Ltd.
- Yehuda Zur
- G01 - MEASURING TESTING
Information Patent Grant
Generating milled structural elements with a flat upper surface
- Patent number 10,971,618
- Issue date Apr 6, 2021
- Applied Materials Israel Ltd.
- Ron Davidescu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filling empty structures with deposition under high-energy SEM for...
- Patent number 10,903,044
- Issue date Jan 26, 2021
- Applied Materials Israel Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FILLING EMPTY STRUCTURES BY DEPOSITION UNDER SEM - BALANCING PARAME...
- Publication number 20240249909
- Publication date Jul 25, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION B...
- Publication number 20240234085
- Publication date Jul 11, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LINE DEPTH MEASUREMENTS BY AFM
- Publication number 20240212976
- Publication date Jun 27, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRECISION IN STEREOSCOPIC MEASUREMENTS USING A PRE-DEPOSITION LAYER
- Publication number 20240153738
- Publication date May 9, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION B...
- Publication number 20240136150
- Publication date Apr 25, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCED DEPOSITION RATE BY APPLYING A NEGATIVE VOLTAGE TO A GAS IN...
- Publication number 20240105421
- Publication date Mar 28, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
OPTIMIZED SADDLE NOZZLE DESIGN FOR GAS INJECTION SYSTEM
- Publication number 20240096592
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCED DEPOSITION RATE BY THERMAL ISOLATION COVER FOR GIS MANIPUL...
- Publication number 20240062990
- Publication date Feb 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Sean Kashy
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
REDUCED CHARGING BY LOW NEGATIVE VOLTAGE IN FIB SYSTEMS
- Publication number 20230343545
- Publication date Oct 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIB DELAYERING ENDPOINT DETECTION BY MONITORING SPUTTERED MATERIALS...
- Publication number 20230104390
- Publication date Apr 6, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYZING A SIDEWALL OF HOLE MILLED IN A SAMPLE TO DETERMINE THICKN...
- Publication number 20230057148
- Publication date Feb 23, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE-CONTROLLED SURFACE WITH A CRYO-NANOMANIPULATOR FOR IMPR...
- Publication number 20230023396
- Publication date Jan 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ANALYZING A BURIED LAYER OF A SAMPLE
- Publication number 20230019567
- Publication date Jan 19, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Alexander Mairov
- G01 - MEASURING TESTING
Information Patent Application
SNR FOR X-RAY DETECTORS IN SEM SYSTEMS BY USING POLARIZATION FILTER
- Publication number 20220397540
- Publication date Dec 15, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY IMAGING IN CROSS-SECTION USING UN-CUT LAMELLA WITH BACKGROUND...
- Publication number 20220367146
- Publication date Nov 17, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACK-SCATTER ELECTRONS (BSE) IMAGING WITH A SEM IN TILTED MODE USIN...
- Publication number 20220351937
- Publication date Nov 3, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-RESOLUTION X-RAY SPECTROSCOPY SURFACE MATERIAL ANALYSIS
- Publication number 20220254598
- Publication date Aug 11, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- G01 - MEASURING TESTING
Information Patent Application
UNIFORM MILLING OF ADJACENT MATERIALS USING PARALLEL SCANNING FIB
- Publication number 20220005670
- Publication date Jan 6, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE GEOMETRY FOR OPTIMAL FOCUSED ION BEAM ETCHING
- Publication number 20210335571
- Publication date Oct 28, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMING A VERTICAL SURFACE
- Publication number 20210082664
- Publication date Mar 18, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GENERATING MILLED STRUCTURAL ELEMENTS WITH A FLAT UPPER SURFACE
- Publication number 20210036142
- Publication date Feb 4, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ron Davidescu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MILLING A MULTI-LAYERED OBJECT
- Publication number 20200384592
- Publication date Dec 10, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Person

Patents Grantslast 30 patents

Analyzing a sidewall of hole milled in a sample to determine thickn...

Reduced charging by low negative voltage in FIB systems

FIB delayering endpoint detection by monitoring sputtered materials...

Uniform milling of adjacent materials using parallel scanning fib

Back-scatter electrons (BSE) imaging with a SEM in tilted mode usin...

Analyzing a buried layer of a sample

SNR for x-ray detectors in SEM systems by using polarization filter

X-ray imaging in cross-section using un-cut lamella with background...

High-resolution x-ray spectroscopy surface material analysis

Adaptive geometry for optimal focused ion beam etching

Holes tilt angle measurement using FIB diagonal cut

Forming a vertical surface

End-point detection for similar adjacent materials

Generating milled structural elements with a flat upper surface

Filling empty structures with deposition under high-energy SEM for...

Patents Applicationslast 30 patents

FILLING EMPTY STRUCTURES BY DEPOSITION UNDER SEM - BALANCING PARAME...

METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION B...

IN-LINE DEPTH MEASUREMENTS BY AFM

PRECISION IN STEREOSCOPIC MEASUREMENTS USING A PRE-DEPOSITION LAYER

METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION B...

ENHANCED DEPOSITION RATE BY APPLYING A NEGATIVE VOLTAGE TO A GAS IN...

OPTIMIZED SADDLE NOZZLE DESIGN FOR GAS INJECTION SYSTEM

ENHANCED DEPOSITION RATE BY THERMAL ISOLATION COVER FOR GIS MANIPUL...

REDUCED CHARGING BY LOW NEGATIVE VOLTAGE IN FIB SYSTEMS

FIB DELAYERING ENDPOINT DETECTION BY MONITORING SPUTTERED MATERIALS...

ANALYZING A SIDEWALL OF HOLE MILLED IN A SAMPLE TO DETERMINE THICKN...

TEMPERATURE-CONTROLLED SURFACE WITH A CRYO-NANOMANIPULATOR FOR IMPR...

ANALYZING A BURIED LAYER OF A SAMPLE

SNR FOR X-RAY DETECTORS IN SEM SYSTEMS BY USING POLARIZATION FILTER

X-RAY IMAGING IN CROSS-SECTION USING UN-CUT LAMELLA WITH BACKGROUND...

BACK-SCATTER ELECTRONS (BSE) IMAGING WITH A SEM IN TILTED MODE USIN...

HIGH-RESOLUTION X-RAY SPECTROSCOPY SURFACE MATERIAL ANALYSIS

UNIFORM MILLING OF ADJACENT MATERIALS USING PARALLEL SCANNING FIB

ADAPTIVE GEOMETRY FOR OPTIMAL FOCUSED ION BEAM ETCHING

FORMING A VERTICAL SURFACE

GENERATING MILLED STRUCTURAL ELEMENTS WITH A FLAT UPPER SURFACE

MILLING A MULTI-LAYERED OBJECT