Yeishin Tung

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Digital holography for alignment in layer deposition
- Patent number 12,163,783
- Issue date Dec 10, 2024
- Applied Materials, Inc.
- Yeishin Tung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
In-line monitoring of OLED layer thickness and dopant concentration
- Patent number 12,137,601
- Issue date Nov 5, 2024
- Applied Materials, Inc.
- Yeishin Tung
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
In-line monitoring of OLED layer thickness and dopant concentration
- Patent number 11,889,740
- Issue date Jan 30, 2024
- Applied Materials, Inc.
- Yeishin Tung
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
In-line monitoring of OLED layer thickness and dopant concentration
- Patent number 11,856,833
- Issue date Dec 26, 2023
- Applied Materials, Inc.
- Yeishin Tung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Non-destructive root cause analysis on blocked contact or via
- Patent number 6,777,676
- Issue date Aug 17, 2004
- KLA-Tencor Technologies Corporation
- Ying Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HEIGHT SENSING SYSTEM FOR ELECTRON BEAM METROLOGY TOOL
- Publication number 20240355579
- Publication date Oct 24, 2024
- KLA Corporation
- Yeishin Tung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION
- Publication number 20240130210
- Publication date Apr 18, 2024
- Applied Materials, Inc.
- Yeishin Tung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION
- Publication number 20230320183
- Publication date Oct 5, 2023
- Applied Materials, Inc.
- Yeishin Tung
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
DIGITAL HOLOGRAPHY FOR ALIGNMENT IN LAYER DEPOSITION
- Publication number 20220341722
- Publication date Oct 27, 2022
- Applied Materials, Inc.
- Yeishin Tung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION
- Publication number 20210226183
- Publication date Jul 22, 2021
- Applied Materials, Inc.
- Yeishin Tung
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION
- Publication number 20210226182
- Publication date Jul 22, 2021
- Applied Materials, Inc.
- Yeishin Tung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUS CENTERING METHOD FOR DIGITAL LITHOGRAPHY
- Publication number 20180024448
- Publication date Jan 25, 2018
- Applied Materials, Inc.
- Yeishin TUNG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Yeishin Tung

Person

Patents Grantslast 30 patents

Digital holography for alignment in layer deposition

In-line monitoring of OLED layer thickness and dopant concentration

In-line monitoring of OLED layer thickness and dopant concentration

In-line monitoring of OLED layer thickness and dopant concentration

Non-destructive root cause analysis on blocked contact or via

Patents Applicationslast 30 patents

HEIGHT SENSING SYSTEM FOR ELECTRON BEAM METROLOGY TOOL

IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION

IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION

DIGITAL HOLOGRAPHY FOR ALIGNMENT IN LAYER DEPOSITION

IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION

IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION

FOCUS CENTERING METHOD FOR DIGITAL LITHOGRAPHY