Yen Lin Leow

Follow

Person

Phoenix, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of forming silicon carbide coated base substrates at multip...
- Patent number 12,180,611
- Issue date Dec 31, 2024
- Applied Materials, Inc.
- Yen Lin Leow
- C30 - CRYSTAL GROWTH
Information Patent Grant
Methods of forming silicon carbide coated base substrates at multip...
- Patent number 11,827,999
- Issue date Nov 28, 2023
- Applied Materials, Inc.
- Yen Lin Leow
- C30 - CRYSTAL GROWTH
Information Patent Grant
System and method for thermally calibrating semiconductor process c...
- Patent number 11,747,209
- Issue date Sep 5, 2023
- ASM IP Holding, B.V.
- Yen Lin Leow
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for thermally calibrating semiconductor process c...
- Patent number 10,732,046
- Issue date Aug 4, 2020
- ASM IP Holding B.V.
- Yen Lin Leow
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF FORMING SILICON CARBIDE COATED BASE SUBSTRATES AT MULTIP...
- Publication number 20240052521
- Publication date Feb 15, 2024
- Applied Materials, Inc.
- Yen Lin LEOW
- C30 - CRYSTAL GROWTH
Information Patent Application
SILICON CARBIDE COATED BASE SUBSTRATES, SILICON CARBIDE SUBSTRATES...
- Publication number 20220220635
- Publication date Jul 14, 2022
- Applied Materials, Inc.
- Yen Lin LEOW
- C30 - CRYSTAL GROWTH
Information Patent Application
SYSTEM AND METHOD FOR THERMALLY CALIBRATING SEMICONDUCTOR PROCESS C...
- Publication number 20200333189
- Publication date Oct 22, 2020
- ASM IP HOLDING B.V.
- Yen Lin Leow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR THERMALLY CALIBRATING SEMICONDUCTOR PROCESS C...
- Publication number 20200080894
- Publication date Mar 12, 2020
- ASM IP HOLDING B.V.
- Yen Lin Leow
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...