Yeng-Kaung Peng

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Saratoga, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for predicting performance of microelectronic device based o...
- Patent number 6,028,994
- Issue date Feb 22, 2000
- Advanced Micro Devices
- Yeng-Kaung Peng
- G01 - MEASURING TESTING
Information Patent Grant
Defect diagnosis using simulation for IC yield improvement
- Patent number 5,886,909
- Issue date Mar 23, 1999
- Advanced Micro Devices, Inc.
- Linda Milor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for automated wafer level testing and reliabil...
- Patent number 5,822,717
- Issue date Oct 13, 1998
- Advanced Micro Devices, Inc.
- Jerry Tsiang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for pattern recognition of wafer test bins
- Patent number 5,787,190
- Issue date Jul 28, 1998
- Advanced Micro Devices, Inc.
- Yeng-Kaung Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real-time in-line defect disposition and yield forecasting system
- Patent number 5,598,341
- Issue date Jan 28, 1997
- Advanced Micro Devices, Inc.
- Zhi-Min Ling
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of failure analysis with CAD layout navigation and FIB/SEM i...
- Patent number 5,561,293
- Issue date Oct 1, 1996
- Advanced Micro Devices, Inc.
- Yeng-Kaung Peng
- H01 - BASIC ELECTRIC ELEMENTS