Yeyuan Yang

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Marietta, GA, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect classification utilizing data from a non-vibrating contact p...
- Patent number 7,900,526
- Issue date Mar 8, 2011
- Qcept Technologies, Inc.
- Jeffrey Alan Hawthorne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor inspection system and apparatus utilizing a non-vibra...
- Patent number 7,659,734
- Issue date Feb 9, 2010
- Qcept Technologies, Inc.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT CLASSIFICATION UTILIZING DATA FROM A NON-VIBRATING CONTACT P...
- Publication number 20090139312
- Publication date Jun 4, 2009
- QCEPT TECHNOLOGIES, INC.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor inspection system and apparatus utilizing a non-vibra...
- Publication number 20080217530
- Publication date Sep 11, 2008
- QCEPT TECHNOLOGIES, INC.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING