Yi-Chang Sung

Follow

Person

Jhubei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Functional resin material, manufacturing method thereof, and moistu...
- Patent number 11,993,674
- Issue date May 28, 2024
- Taiwan Textile Research Institute
- Sun-Wen Juan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Intrinsic fluorescent green fiber and manufacturing method thereof
- Patent number 11,746,285
- Issue date Sep 5, 2023
- Taiwan Textile Research Institute
- Rih-Sheng Chiang
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Grant
Method to predict and identify defocus wafers
- Patent number 7,301,604
- Issue date Nov 27, 2007
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Hung Lin
- G01 - MEASURING TESTING
Information Patent Grant
Method of wafer height mapping
- Patent number 6,975,407
- Issue date Dec 13, 2005
- Taiwan Semiconductor Manufacturing Co, Ltd.
- Chun-Sheng Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FUNCTIONAL RESIN MATERIAL, MANUFACTURING METHOD THEREOF, AND MOISTU...
- Publication number 20220010050
- Publication date Jan 13, 2022
- TAIWAN TEXTILE RESEARCH INSTITUTE
- Sun-Wen JUAN
- B82 - NANO-TECHNOLOGY
Information Patent Application
INTRINSIC FLUORESCENT GREEN FIBER AND MANUFACTURING METHOD THEREOF
- Publication number 20210189232
- Publication date Jun 24, 2021
- TAIWAN TEXTILE RESEARCH INSTITUTE
- Rih-Sheng CHIANG
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
METHOD OF WAFER HEIGHT MAPPING
- Publication number 20050259272
- Publication date Nov 24, 2005
- Chun-Sheng Wang
- G01 - MEASURING TESTING
Information Patent Application
Method to predict and identify defocus wafers
- Publication number 20050185170
- Publication date Aug 25, 2005
- Chun-Hung Lin
- G01 - MEASURING TESTING