Yi-Chung Sheng

Person

Tainan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
High electron mobility transistor (HEMT) and forming method thereof
- Patent number 11,705,512
- Issue date Jul 18, 2023
- United Microelectronics Corp.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High electron mobility transistor (HEMT) and forming method thereof
- Patent number 11,631,761
- Issue date Apr 18, 2023
- United Microelectronics Corp.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming fin forced stack inverter
- Patent number 11,316,031
- Issue date Apr 26, 2022
- United Microelectronics Corp.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High electron mobility transistor (HEMT) and forming method thereof
- Patent number 11,296,214
- Issue date Apr 5, 2022
- United Microelectronics Corp.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of forming the same
- Patent number 10,867,999
- Issue date Dec 15, 2020
- United Microelectronics Corp.
- Meng-Chiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive random access memory wherein number of memory cell...
- Patent number 10,700,126
- Issue date Jun 30, 2020
- United Microelectronics Corp.
- Ting-Hsiang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
1-1 fin forced stack inverter
- Patent number 10,580,883
- Issue date Mar 3, 2020
- United Microelectronics Corp.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intra-metal capacitor and method of forming the same
- Patent number 10,529,707
- Issue date Jan 7, 2020
- United Microelectronics Corp.
- Hsin-Hsien Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating single diffusion break structure directly un...
- Patent number 10,256,155
- Issue date Apr 9, 2019
- United Microelectronics Corp.
- Wen-Kai Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test key structure and method of measuring resistance of vias
- Patent number 10,247,774
- Issue date Apr 2, 2019
- United Microelectronics Corp.
- Hsin-Hsien Chen
- G01 - MEASURING TESTING
Information Patent Grant
Intra-metal capacitor and method of forming the same
- Patent number 10,002,864
- Issue date Jun 19, 2018
- United Microelectronics Corp.
- Hsin-Hsien Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor circuit structure
- Patent number 8,850,370
- Issue date Sep 30, 2014
- United Microelectronics Corporation
- Chia-Chen Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having metal gate and manufacturing method the...
- Patent number 8,673,755
- Issue date Mar 18, 2014
- United Microelectronics Corp.
- Chu-Chun Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor circuit structure
- Patent number 8,624,398
- Issue date Jan 7, 2014
- United Microelectronics Corp.
- Chia-Chen Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing complementary metal oxide semiconductor device
- Patent number 8,278,166
- Issue date Oct 2, 2012
- United Microelectronics Corp.
- Chun-Chia Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a semiconductor device
- Patent number 8,207,043
- Issue date Jun 26, 2012
- United Microelectronics Corp.
- Huang-Yi Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting photoresist pattern
- Patent number 7,932,104
- Issue date Apr 26, 2011
- United Microelectronics Corp.
- Chia-Chen Sun
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor MOS transistor device and method for making the same
- Patent number 7,749,833
- Issue date Jul 6, 2010
- United Microelectronics Corp.
- Shyh-Fann Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating strained-silicon transistors
- Patent number 7,550,356
- Issue date Jun 23, 2009
- United Microelectronics Corp.
- Cheng-Tung Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor MOS transistor device and method for making the same
- Patent number 7,508,053
- Issue date Mar 24, 2009
- United Microelectronics Corp.
- Shyh-Fann Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor MOS transistor device and method for making the same
- Patent number 7,342,284
- Issue date Mar 11, 2008
- United Microelectronics Corp.
- Shyh-Fann Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring a gate channel length of a metal-oxide semicond...
- Patent number 6,955,929
- Issue date Oct 18, 2005
- United Microelectronics Corp.
- Cheng-Tung Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor device for preventing polysilic...
- Patent number 6,544,849
- Issue date Apr 8, 2003
- United Microelectronics Corp.
- Shih-Chieh Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a CMOS transistor
- Patent number 6,127,212
- Issue date Oct 3, 2000
- United Microelectronics Corp.
- Chin-Lan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a word line
- Patent number 6,103,606
- Issue date Aug 15, 2000
- United Microelectronics Corp.
- Der-Yuan Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multilayer ONO structure
- Patent number 5,981,404
- Issue date Nov 9, 1999
- United Microelectronics Corp.
- Yi Chung Sheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing shallow trench isolation
- Patent number 5,904,540
- Issue date May 18, 1999
- United Microelectronics, Corp.
- Yi-Chung Sheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating tetra-state mask read only memory
- Patent number 5,891,779
- Issue date Apr 6, 1999
- United Microelectronics Corp.
- Cheng-Hui Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tri-state read-only memory device and method for fabricating the same
- Patent number 5,859,460
- Issue date Jan 12, 1999
- United Microelectronics Corporation
- Kuan-Cheng Su
- G11 - INFORMATION STORAGE
Information Patent Grant
Silicide process for manufacturing a mask ROM
- Patent number 5,854,109
- Issue date Dec 29, 1998
- United Microelectronics Corp.
- Yi-Chung Sheng
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) AND FORMING METHOD THEREOF
- Publication number 20220181478
- Publication date Jun 9, 2022
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) AND FORMING METHOD THEREOF
- Publication number 20220173236
- Publication date Jun 2, 2022
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) AND FORMING METHOD THEREOF
- Publication number 20210020769
- Publication date Jan 21, 2021
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING FIN FORCED STACK INVERTER
- Publication number 20200152768
- Publication date May 14, 2020
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME
- Publication number 20200126978
- Publication date Apr 23, 2020
- UNITED MICROELECTRONICS CORP.
- Meng-Chiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETORESISTIVE RANDOM ACESS MEMORY WHEREIN NUMBER OF MEMORY CELLS...
- Publication number 20200091229
- Publication date Mar 19, 2020
- UNITED MICROELECTRONICS CORP.
- Ting-Hsiang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
1-1 FIN FORCED STACK INVERTER AND METHOD OF FORMING FIN FORCED STAC...
- Publication number 20190252518
- Publication date Aug 15, 2019
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTRA-METAL CAPACITOR AND METHOD OF FORMING THE SAME
- Publication number 20180269201
- Publication date Sep 20, 2018
- UNITED MICROELECTRONICS CORP.
- Hsin-Hsien Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST KEY STRUCTURE AND METHOD OF MEASURING RESISTANCE OF VIAS
- Publication number 20180156862
- Publication date Jun 7, 2018
- UNITED MICROELECTRONICS CORP.
- Hsin-Hsien Chen
- G01 - MEASURING TESTING
Information Patent Application
INTRA-METAL CAPACITOR AND METHOD OF FORMING THE SAME
- Publication number 20180151555
- Publication date May 31, 2018
- UNITED MICROELECTRONICS CORP.
- Hsin-Hsien Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180130753
- Publication date May 10, 2018
- UNITED MICROELECTRONICS CORP.
- Chih-Kai Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYOUT METHOD OF SEMICONDUCTOR CIRCUIT STRUCTURE
- Publication number 20140089869
- Publication date Mar 27, 2014
- UNITED MICROELECTRONICS CORPORATION
- Chia-Chen SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Integrated Structure
- Publication number 20130277754
- Publication date Oct 24, 2013
- Chia-Wen Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING METAL GATE AND MANUFACTURING METHOD THE...
- Publication number 20130105903
- Publication date May 2, 2013
- Chu-Chun Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING COMPLEMENTARY METAL OXIDE SEMICONDUCTOR DEVICE
- Publication number 20120012938
- Publication date Jan 19, 2012
- Chun-Chia Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE
- Publication number 20110076823
- Publication date Mar 31, 2011
- Huang-Yi Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Circuit Structure and Layout Method thereof
- Publication number 20110049722
- Publication date Mar 3, 2011
- Chia-Chen Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INSPECTING PHOTORESIST PATTERN
- Publication number 20100297791
- Publication date Nov 25, 2010
- Chia-Chen Sun
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR MOS TRANSISTOR DEVICE AND METHOD FOR MAKING THE SAME
- Publication number 20090137089
- Publication date May 28, 2009
- Shyh-Fann Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MOS TRANSISTOR DEVICE AND METHOD FOR MAKING THE SAME
- Publication number 20080093627
- Publication date Apr 24, 2008
- Shyh-Fann Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MOS TRANSISTOR DEVICE AND METHOD FOR MAKING THE SAME
- Publication number 20070187727
- Publication date Aug 16, 2007
- Shyh-Fann Ting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of fabricating strained-silicon transistors
- Publication number 20070111416
- Publication date May 17, 2007
- Cheng-Tung Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING A SILICIDE
- Publication number 20070087542
- Publication date Apr 19, 2007
- Jen-Hong Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING A SILICIDE
- Publication number 20070042584
- Publication date Feb 22, 2007
- Jen-Hong Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING A GATE CHANNEL LENGTH OF A METAL-OXIDE SEMICOND...
- Publication number 20040214356
- Publication date Oct 28, 2004
- Cheng-Tung Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing a transistor with a footed offset spacer
- Publication number 20020182834
- Publication date Dec 5, 2002
- Cheng-Tung Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of fabricating semiconductor device for preventing polysilic...
- Publication number 20020160601
- Publication date Oct 31, 2002
- United Microelectronics Corp.
- Shih-Chieh Hsu
- H01 - BASIC ELECTRIC ELEMENTS

Yi-Chung Sheng

Person

Patents Grantslast 30 patents

High electron mobility transistor (HEMT) and forming method thereof

High electron mobility transistor (HEMT) and forming method thereof

Method of forming fin forced stack inverter

High electron mobility transistor (HEMT) and forming method thereof

Semiconductor device and method of forming the same

Magnetoresistive random access memory wherein number of memory cell...

1-1 fin forced stack inverter

Intra-metal capacitor and method of forming the same

Method for fabricating single diffusion break structure directly un...

Test key structure and method of measuring resistance of vias

Intra-metal capacitor and method of forming the same

Method of manufacturing semiconductor circuit structure

Semiconductor device having metal gate and manufacturing method the...

Semiconductor circuit structure

Method of manufacturing complementary metal oxide semiconductor device

Method for fabricating a semiconductor device

Method for inspecting photoresist pattern

Semiconductor MOS transistor device and method for making the same

Method of fabricating strained-silicon transistors

Semiconductor MOS transistor device and method for making the same

Semiconductor MOS transistor device and method for making the same

Method of measuring a gate channel length of a metal-oxide semicond...

Method of fabricating semiconductor device for preventing polysilic...

Method of forming a CMOS transistor

Method of fabricating a word line

Multilayer ONO structure

Method for manufacturing shallow trench isolation

Method of fabricating tetra-state mask read only memory

Tri-state read-only memory device and method for fabricating the same

Silicide process for manufacturing a mask ROM

Patents Applicationslast 30 patents

HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) AND FORMING METHOD THEREOF

HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) AND FORMING METHOD THEREOF

HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) AND FORMING METHOD THEREOF

METHOD OF FORMING FIN FORCED STACK INVERTER

SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME

MAGNETORESISTIVE RANDOM ACESS MEMORY WHEREIN NUMBER OF MEMORY CELLS...

1-1 FIN FORCED STACK INVERTER AND METHOD OF FORMING FIN FORCED STAC...

INTRA-METAL CAPACITOR AND METHOD OF FORMING THE SAME

TEST KEY STRUCTURE AND METHOD OF MEASURING RESISTANCE OF VIAS

INTRA-METAL CAPACITOR AND METHOD OF FORMING THE SAME

SEMICONDUCTOR DEVICE

LAYOUT METHOD OF SEMICONDUCTOR CIRCUIT STRUCTURE

Semiconductor Integrated Structure

SEMICONDUCTOR DEVICE HAVING METAL GATE AND MANUFACTURING METHOD THE...

METHOD OF MANUFACTURING COMPLEMENTARY METAL OXIDE SEMICONDUCTOR DEVICE

METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE

Semiconductor Circuit Structure and Layout Method thereof

METHOD FOR INSPECTING PHOTORESIST PATTERN

SEMICONDUCTOR MOS TRANSISTOR DEVICE AND METHOD FOR MAKING THE SAME

SEMICONDUCTOR MOS TRANSISTOR DEVICE AND METHOD FOR MAKING THE SAME

SEMICONDUCTOR MOS TRANSISTOR DEVICE AND METHOD FOR MAKING THE SAME

Method of fabricating strained-silicon transistors

METHOD OF FORMING A SILICIDE

METHOD OF FORMING A SILICIDE

METHOD OF MEASURING A GATE CHANNEL LENGTH OF A METAL-OXIDE SEMICOND...

Method of manufacturing a transistor with a footed offset spacer

Method of fabricating semiconductor device for preventing polysilic...