Yi Feng

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Hopewell Junction, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe-able voltage contrast test structures
- Patent number 9,213,060
- Issue date Dec 15, 2015
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Grant
Probe-able voltage contrast test structures
- Patent number 9,103,875
- Issue date Aug 11, 2015
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Grant
Probe-able voltage contrast test structures
- Patent number 9,097,760
- Issue date Aug 4, 2015
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Grant
Probe-able voltage contrast test structures
- Patent number 8,350,583
- Issue date Jan 8, 2013
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES
- Publication number 20120319715
- Publication date Dec 20, 2012
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Application
PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES
- Publication number 20120319714
- Publication date Dec 20, 2012
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Application
PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES
- Publication number 20120319716
- Publication date Dec 20, 2012
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Application
PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES
- Publication number 20110037493
- Publication date Feb 17, 2011
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING