Yi Jin

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Electronic tester and testing method
- Patent number 11,971,450
- Issue date Apr 30, 2024
- Rohde & Schwarz GmbH & Co. KG
- Yi Jin
- G01 - MEASURING TESTING
Information Patent Grant
Test system and method for testing a device under test having sever...
- Patent number 10,969,455
- Issue date Apr 6, 2021
- Rohde & Schwarz GmbH & Co. KG
- Yi Jin
- G01 - MEASURING TESTING
Information Patent Grant
Framework that maximizes the usage of testhead resources in in-circ...
- Patent number 7,253,606
- Issue date Aug 7, 2007
- Agilent Technologies, Inc.
- Aik Koon Loh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED COMPLIANCE TESTING OF A DUT WITH COMMUNICATION INTERFACES
- Publication number 20240275711
- Publication date Aug 15, 2024
- ROHDE & SCHWARZ GMBH & CO. KG
- Yi JIN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ELECTRONIC TESTER AND TESTING METHOD
- Publication number 20230176124
- Publication date Jun 8, 2023
- Rohde& Schwarz GmbH & Co. KG
- Yi JIN
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AS WELL AS METHOD FOR TESTING A DEVICE UNDER TEST
- Publication number 20200116812
- Publication date Apr 16, 2020
- ROHDE & SCHWARZ GMBH & CO. KG
- Yi Jin
- G01 - MEASURING TESTING