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Yi Liu
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Milpitas, CA, US
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last 30 patents
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Patent Grant
Selecting parameters for defect detection methods
Patent number
9,310,316
Issue date
Apr 12, 2016
KLA-Tencor Corp.
Kenong Wu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Selecting Parameters for Defect Detection Methods
Publication number
20140072203
Publication date
Mar 13, 2014
KLA-Tencor Corporation
Kenong Wu
G01 - MEASURING TESTING