Yi-Ming CHAN

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Chu-Pei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for probing die electricity and method for forming the same
- Patent number 9,506,978
- Issue date Nov 29, 2016
- MPI Corporation
- Chung-Tse Lee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for probing die electricity and method for forming the same
- Patent number 9,157,929
- Issue date Oct 13, 2015
- MPI Corporation
- Chung-Tse Lee
- G01 - MEASURING TESTING
Information Patent Grant
Production information system enhanced for availability
- Patent number 5,842,222
- Issue date Nov 24, 1998
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Ching Lin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR PROBING DIE ELECTRICITY AND METHOD FOR FORMING THE SAME
- Publication number 20150377957
- Publication date Dec 31, 2015
- MPI Corporation
- Chung-Tse LEE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR PROBING DIE ELECTRICITY AND METHOD FOR FORMING THE SAME
- Publication number 20130147507
- Publication date Jun 13, 2013
- MJC PROBE INC.
- CHUNG-TSE LEE
- G01 - MEASURING TESTING