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Patents Grants
last 30 patents
Information
Patent Grant
Terahertz metamaterial waveguide and device
Patent number
11,275,198
Issue date
Mar 15, 2022
Shenzhen Terahertz System Equipment Co., Ltd.
Yi Pan
G02 - OPTICS
Information
Patent Grant
Terahertz spectrum test device and system
Patent number
11,215,555
Issue date
Jan 4, 2022
SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION CO., LTD.
Cui Guo
G01 - MEASURING TESTING
Information
Patent Grant
Plasmon waveguide, biosensor chip and system
Patent number
11,125,684
Issue date
Sep 21, 2021
Shenzhen Institute of Terahertz Technology and Innovation
Yi Pan
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz full-polarization-state detection spectrograph
Patent number
10,983,048
Issue date
Apr 20, 2021
Shenzhen Terahertz System Equipment Co., Ltd.
Yi Pan
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz time-domain spectroscopy system
Patent number
10,408,679
Issue date
Sep 10, 2019
Shenzhen Institute of Terahertz Technology and Innovation
Shichang Peng
G01 - MEASURING TESTING
Information
Patent Grant
Delay line device and terahertz time-domain spectrometer system
Patent number
10,161,790
Issue date
Dec 25, 2018
Shenzhen Institute of Terahertz Technology and Innovation
Qing Ding
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PLASMON WAVEGUIDE, BIOSENSOR CHIP AND SYSTEM
Publication number
20210041356
Publication date
Feb 11, 2021
SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION
Yi PAN
G01 - MEASURING TESTING
Information
Patent Application
Terahertz Full-Polarization-State Detection Spectrograph
Publication number
20200284722
Publication date
Sep 10, 2020
Shenzhen Institute of Terahertz Technology and Innovation
Yi Pan
G01 - MEASURING TESTING
Information
Patent Application
Terahertz Metamaterial Waveguide And Device
Publication number
20200217984
Publication date
Jul 9, 2020
Shenzhen Terahertz System Equipment Co., Ltd.
Yi Pan
G02 - OPTICS
Information
Patent Application
TERAHERTZ SPECTRUM TEST DEVICE AND SYSTEM
Publication number
20200209154
Publication date
Jul 2, 2020
SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION CO., LTD.
Cui GUO
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ FULL POLARIZATION STATE DETECTION SPECTROMETER
Publication number
20190003964
Publication date
Jan 3, 2019
Shenzhen Institute of Terahertz Tchnology and Innovation Co., Ltd.
Qing Ding
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ TIME-DOMAIN SPECTROSCOPY SYSTEM
Publication number
20180306644
Publication date
Oct 25, 2018
SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION CO., LTD.
Shichang PENG
G01 - MEASURING TESTING
Information
Patent Application
Delay Line Device And Terahertz Time-Domain Spectrometer System
Publication number
20180274978
Publication date
Sep 27, 2018
Shenzhen Institute of Terahertz Technology and Innovation
Qing Ding
G01 - MEASURING TESTING