Yi-Sha KU

Person

Hsinchu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Heterogeneous integration detecting method and heterogeneous integr...
- Patent number 12,007,221
- Issue date Jun 11, 2024
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Grant
Light-emitting device and manufacturing method thereof
- Patent number 11,282,982
- Issue date Mar 22, 2022
- Epistar Corporation
- Li-Ming Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimension measurement device and operation method thereof
- Patent number 11,248,903
- Issue date Feb 15, 2022
- Industrial Technology Research Institute
- Chia-Hung Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Light-emitting devices
- Patent number 10,658,544
- Issue date May 19, 2020
- Epistar Corporation
- Chao-Hsing Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light-emitting devices
- Patent number 10,304,999
- Issue date May 28, 2019
- Epistar Corporation
- Chao-Hsing Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scattering measurement system and method
- Patent number 10,094,774
- Issue date Oct 9, 2018
- Industrial Technology Research Institute
- Chia-Liang Yeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light-emitting devices
- Patent number 9,876,138
- Issue date Jan 23, 2018
- Epistar Corporation
- Chao-Hsing Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system
- Patent number 9,752,866
- Issue date Sep 5, 2017
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Grant
Light-emitting devices
- Patent number 9,472,725
- Issue date Oct 18, 2016
- Epistar Corporation
- Chao-Hsing Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light-emitting device
- Patent number 9,276,173
- Issue date Mar 1, 2016
- Epistar Corporation
- Chien-Fu Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for measuring a stacking overlay error by focusin...
- Patent number 9,182,681
- Issue date Nov 10, 2015
- Industrial Technology Research Institute
- Deh Ming Shyu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Light-emitting device
- Patent number 9,159,881
- Issue date Oct 13, 2015
- Epistar Corporation
- Jia-Kuen Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light-emitting devices
- Patent number 9,048,379
- Issue date Jun 2, 2015
- Epistar Corporation
- Chao-Hsing Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light-emitting device
- Patent number 9,035,329
- Issue date May 19, 2015
- Epistar Corporation
- Chao-Hsing Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement systems and measurement methods
- Patent number 8,830,458
- Issue date Sep 9, 2014
- Industrial Technology Research Institute
- Deh Ming Shyu
- G01 - MEASURING TESTING
Information Patent Grant
Light-emitting device
- Patent number 8,823,039
- Issue date Sep 2, 2014
- Epistar Corporation
- Chien-Fu Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method and computer readable medium for through silicon via...
- Patent number 8,699,021
- Issue date Apr 15, 2014
- Industrial Technology Research Institute
- Yi Sha Ku
- G01 - MEASURING TESTING
Information Patent Grant
Light-emitting devices
- Patent number 8,598,614
- Issue date Dec 3, 2013
- Epistar Corporation
- Chao-Hsing Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring via bottom profile
- Patent number 8,537,213
- Issue date Sep 17, 2013
- Industrial Technology Research Institute
- Deh-Ming Shyu
- G01 - MEASURING TESTING
Information Patent Grant
Light-emitting diode array
- Patent number D687396
- Issue date Aug 6, 2013
- Epistar Corporation
- Chao-Hsing Chen
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Method for designing overlay targets and method and system for meas...
- Patent number 8,386,969
- Issue date Feb 26, 2013
- Industrial Technology Research Institute
- Wei Te Hsu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scatterfield microscopical measuring method and apparatus
- Patent number 8,319,971
- Issue date Nov 27, 2012
- Industrial Technology Research Institute
- Deh-Ming Shyu
- G01 - MEASURING TESTING
Information Patent Grant
Method for designing two-dimensional array overlay targets and meth...
- Patent number 8,321,821
- Issue date Nov 27, 2012
- Industrial Technology Research Institute
- Yi Sha Ku
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for designing two-dimensional array overlay target sets and...
- Patent number 8,250,497
- Issue date Aug 21, 2012
- Industrial Technology Research Institute
- Wei Te Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Light-emitting device
- Patent number 8,188,505
- Issue date May 29, 2012
- Epistar Corporation
- Chien-Fu Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for via structure measurement
- Patent number 8,139,233
- Issue date Mar 20, 2012
- Industrial Technology Research Institute
- Yi Sha Ku
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting diode and manufacturing method thereof
- Patent number 8,076,686
- Issue date Dec 13, 2011
- Epistar Corporation
- Kuo-Hui Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scatterfield microscopical measurement
- Patent number 7,872,741
- Issue date Jan 18, 2011
- Industrial Technology Research Institute
- Sen-Yih Chou
- G01 - MEASURING TESTING
Information Patent Grant
Reflective scatterometer
- Patent number 7,864,324
- Issue date Jan 4, 2011
- Industrial Technology Research Institute
- Deh-Ming Shyu
- G01 - MEASURING TESTING
Information Patent Grant
Overlay measurement target
- Patent number 7,847,939
- Issue date Dec 7, 2010
- Nanometrics Incorporated
- Nigel Peter Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE DEPTH-MEASURING DEVICE AND METHOD
- Publication number 20240331178
- Publication date Oct 3, 2024
- Industrial Technology Research Institute
- Chia-Hung CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HETEROGENEOUS INTEGRATION DETECTING METHOD AND HETEROGENEOUS INTEGR...
- Publication number 20230152086
- Publication date May 18, 2023
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-EMITTING DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20220173272
- Publication date Jun 2, 2022
- EPISTAR CORPORATION
- Li-Ming CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSION MEASUREMENT DEVICE AND OPERATION METHOD THEREOF
- Publication number 20210080252
- Publication date Mar 18, 2021
- Industrial Technology Research Institute
- Chia-Hung CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHT-EMITTING DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20200243714
- Publication date Jul 30, 2020
- EPISTAR CORPORATION
- Li-Ming CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT-EMITTING DEVICES
- Publication number 20190237624
- Publication date Aug 1, 2019
- EPISTAR CORPORATION
- Chao-Hsing CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT-EMITTING DEVICES
- Publication number 20180108807
- Publication date Apr 19, 2018
- EPISTAR CORPORATION
- Chao-Hsing CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT SYSTEM
- Publication number 20170146339
- Publication date May 25, 2017
- Industrial Technology Research Institute
- Hsiang-Chun WEI
- G01 - MEASURING TESTING
Information Patent Application
SCATTERING MEASUREMENT SYSTEM AND METHOD
- Publication number 20170082536
- Publication date Mar 23, 2017
- Industrial Technology Research Institute
- Chia-Liang YEH
- G01 - MEASURING TESTING
Information Patent Application
SCATTERING MEASUREMENT SYSTEM AND METHOD
- Publication number 20170045355
- Publication date Feb 16, 2017
- Industrial Technology Research Institute
- Yi-Chen HSIEH
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-EMITTING DEVICES
- Publication number 20170012167
- Publication date Jan 12, 2017
- EPISTAR CORPORATION
- Chao-Hsing CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT-EMITTING DEVICES
- Publication number 20150236208
- Publication date Aug 20, 2015
- EPISTAR CORPORATION
- Chao-Hsing CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT-EMITTING DEVICE
- Publication number 20140367733
- Publication date Dec 18, 2014
- Chien-Fu SHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THICKNESS MEASURING SYSTEM AND METHOD FOR A BONDING LAYER
- Publication number 20140333936
- Publication date Nov 13, 2014
- Industrial Technology Research Institute
- Po-Yi CHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING A STACKING OVERLAY ERROR
- Publication number 20140118721
- Publication date May 1, 2014
- Industrial Technology Research Institute
- Deh Ming Shyu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LIGHT-EMITTING DEVICES
- Publication number 20140084324
- Publication date Mar 27, 2014
- EPISTAR CORPORATION
- Chao-Hsing CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT SYSTEMS AND MEASUREMENT METHODS
- Publication number 20140085640
- Publication date Mar 27, 2014
- Industrial Technology Research Institute
- Deh Ming Shyu
- G01 - MEASURING TESTING
Information Patent Application
THIN METAL FILM MEASUREMENT METHOD
- Publication number 20120290239
- Publication date Nov 15, 2012
- Industrial Technology Research Institute
- Yi-Sha Ku
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-EMITTING DEVICE
- Publication number 20120211794
- Publication date Aug 23, 2012
- EPISTAR CORPORATION
- Chien-Fu Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM, METHOD AND COMPUTER READABLE MEDIUM FOR THROUGH SILICON VIA...
- Publication number 20120197592
- Publication date Aug 2, 2012
- Industrial Technology Research Institute
- Yi Sha KU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING VIA BOTTOM PROFILE
- Publication number 20120147171
- Publication date Jun 14, 2012
- Industrial Technology Research Institute
- Deh-Ming Shyu
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-EMITTING DEVICES
- Publication number 20120049227
- Publication date Mar 1, 2012
- Chao-Hsing CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DESIGNING OVERLAY TARGETS AND METHOD AND SYSTEM FOR MEAS...
- Publication number 20110320986
- Publication date Dec 29, 2011
- Industrial Technology Research Institute
- WEI TE HSU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR VIA STRUCTURE MEASUREMENT
- Publication number 20110172974
- Publication date Jul 14, 2011
- Industrial Technology Research Institute
- Yi Sha KU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DESIGNING TWO-DIMENSIONAL ARRAY OVERLAY TARGET SETS AND...
- Publication number 20110154272
- Publication date Jun 23, 2011
- Industrial Technology Research Institute
- Wei Te Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DESIGNING TWO-DIMENSIONAL ARRAY OVERLAY TARGETS AND METH...
- Publication number 20110131538
- Publication date Jun 2, 2011
- Industrial Technology Research Institute
- Yi Sha KU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REFLECTIVE SCATTEROMETER
- Publication number 20100053627
- Publication date Mar 4, 2010
- Industrial Technology Research Institute
- Deh-Ming SHYU
- G01 - MEASURING TESTING
Information Patent Application
SCATTERFIELD MICROSCOPICAL MEASURING METHOD AND APPARATUS
- Publication number 20100007881
- Publication date Jan 14, 2010
- Industrial Technology Research Institute
- Deh-Ming Shyu
- G02 - OPTICS
Information Patent Application
METHOD FOR DESIGNING OVERLAY TARGETS AND METHOD AND SYSTEM FOR MEAS...
- Publication number 20090313589
- Publication date Dec 17, 2009
- Industrial Technology Research Institute
- WEI TE HSU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Light emitting diode and manufacturing method thereof
- Publication number 20090224272
- Publication date Sep 10, 2009
- EPISTAR CORPORATION
- Kuo-Hui Yu
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Heterogeneous integration detecting method and heterogeneous integr...

Light-emitting device and manufacturing method thereof

Three-dimension measurement device and operation method thereof

Light-emitting devices

Light-emitting devices

Scattering measurement system and method

Light-emitting devices

Measurement system

Light-emitting devices

Light-emitting device

Method and system for measuring a stacking overlay error by focusin...

Light-emitting device

Light-emitting devices

Light-emitting device

Measurement systems and measurement methods

Light-emitting device

System, method and computer readable medium for through silicon via...

Light-emitting devices

Method for measuring via bottom profile

Light-emitting diode array

Method for designing overlay targets and method and system for meas...

Scatterfield microscopical measuring method and apparatus

Method for designing two-dimensional array overlay targets and meth...

Method for designing two-dimensional array overlay target sets and...

Light-emitting device

System and method for via structure measurement

Light emitting diode and manufacturing method thereof

Method and apparatus for scatterfield microscopical measurement

Reflective scatterometer

Overlay measurement target

Patents Applicationslast 30 patents

SAMPLE DEPTH-MEASURING DEVICE AND METHOD

HETEROGENEOUS INTEGRATION DETECTING METHOD AND HETEROGENEOUS INTEGR...

LIGHT-EMITTING DEVICE AND MANUFACTURING METHOD THEREOF

THREE-DIMENSION MEASUREMENT DEVICE AND OPERATION METHOD THEREOF

LIGHT-EMITTING DEVICE AND MANUFACTURING METHOD THEREOF

LIGHT-EMITTING DEVICES

LIGHT-EMITTING DEVICES

MEASUREMENT SYSTEM

SCATTERING MEASUREMENT SYSTEM AND METHOD

SCATTERING MEASUREMENT SYSTEM AND METHOD

LIGHT-EMITTING DEVICES

LIGHT-EMITTING DEVICES

LIGHT-EMITTING DEVICE

THICKNESS MEASURING SYSTEM AND METHOD FOR A BONDING LAYER

METHOD AND SYSTEM FOR MEASURING A STACKING OVERLAY ERROR

LIGHT-EMITTING DEVICES

MEASUREMENT SYSTEMS AND MEASUREMENT METHODS

THIN METAL FILM MEASUREMENT METHOD

LIGHT-EMITTING DEVICE

SYSTEM, METHOD AND COMPUTER READABLE MEDIUM FOR THROUGH SILICON VIA...

METHOD FOR MEASURING VIA BOTTOM PROFILE

LIGHT-EMITTING DEVICES

METHOD FOR DESIGNING OVERLAY TARGETS AND METHOD AND SYSTEM FOR MEAS...

SYSTEM AND METHOD FOR VIA STRUCTURE MEASUREMENT

METHOD FOR DESIGNING TWO-DIMENSIONAL ARRAY OVERLAY TARGET SETS AND...

METHOD FOR DESIGNING TWO-DIMENSIONAL ARRAY OVERLAY TARGETS AND METH...

REFLECTIVE SCATTEROMETER

SCATTERFIELD MICROSCOPICAL MEASURING METHOD AND APPARATUS

METHOD FOR DESIGNING OVERLAY TARGETS AND METHOD AND SYSTEM FOR MEAS...

Light emitting diode and manufacturing method thereof