Yi Wei Liu

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Dongguan City, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method of nano thin film thickness measurement by auger electron sp...
- Patent number 7,582,868
- Issue date Sep 1, 2009
- SAE Magnetics (H.K.) Ltd.
- Zhi Cheng Jiang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of nano thin film thickness measurement by auger electron sp...
- Publication number 20060138326
- Publication date Jun 29, 2006
- Zhi Cheng Jiang
- G01 - MEASURING TESTING