TREA

Yichen ZHANG

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  • Eindhoven, NL
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Patents Grantslast 30 patents

  • Information Patent Grant

    Computational metrology based sampling scheme
    • Patent number 12,044,979
    • Issue date Jul 23, 2024
    • ASML Netherlands B.V.
    • Wim Tjibbo Tel
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Computational metrology based sampling scheme
    • Patent number 11,635,698
    • Issue date Apr 25, 2023
    • ASML Netherlands B.V.
    • Wim Tjibbo Tel
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Computational metrology
    • Patent number 11,347,150
    • Issue date May 31, 2022
    • ASML Netherlands B.V.
    • Wim Tjibbo Tel
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Methods using fingerprint and evolution analysis
    • Patent number 11,281,110
    • Issue date Mar 22, 2022
    • ASML Netherlands B.V.
    • Jeroen Van Dongen
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Device manufacturing method
    • Patent number 11,061,336
    • Issue date Jul 13, 2021
    • ASML Netherlands B.V.
    • Hubertus Johannes Gertrudus Simons
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Computational metrology
    • Patent number 10,990,018
    • Issue date Apr 27, 2021
    • ASML Netherlands B.V.
    • Wim Tjibbo Tel
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

  • Information Patent Application

    COMPUTATIONAL METROLOGY BASED SAMPLING SCHEME
    • Publication number 20240377756
    • Publication date Nov 14, 2024
    • ASML NETHERLANDS B.V.
    • Wim Tjibbo TEL
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    COMPUTATIONAL METROLOGY BASED SAMPLING SCHEME
    • Publication number 20230221654
    • Publication date Jul 13, 2023
    • ASML NETHERLANDS B.V.
    • Wim Tjibbo TEL
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    DETERMINING LITHOGRAPHIC MATCHING PERFORMANCE
    • Publication number 20220334503
    • Publication date Oct 20, 2022
    • ASML NETHERLANDS B.V.
    • Yingchao CUI
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    COMPUTATIONAL METROLOGY
    • Publication number 20220260925
    • Publication date Aug 18, 2022
    • ASML NETHERLANDS B.V.
    • Wim Tjibbo TEL
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    METHOD IN THE MANUFACTURING PROCESS OF A DEVICE, A NON-TRANSITORY C...
    • Publication number 20210407112
    • Publication date Dec 30, 2021
    • ASML NETHERLANDS B.V.
    • Wim Tjibbo TEL
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    METHODS USING FINGERPRINT AND EVOLUTION ANALYSIS
    • Publication number 20210255547
    • Publication date Aug 19, 2021
    • ASML NETHERLANDS B.V.
    • Jeroen Van Dongen
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    COMPUTATIONAL METROLOGY
    • Publication number 20210191278
    • Publication date Jun 24, 2021
    • ASML NETHERLANDS B.V.
    • Wim Tjibbo TEL
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    COMPUTATIONAL METROLOGY BASED SAMPLING SCHEME
    • Publication number 20200371441
    • Publication date Nov 26, 2020
    • ASML NETHERLANDS B.V.
    • Wim Tjibbo TEL
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    DEVICE MANUFACTURING METHOD
    • Publication number 20200081353
    • Publication date Mar 12, 2020
    • ASML NETHERLANDS B.V.
    • Hubertus Johannes Gertrudus SIMONS
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    COMPUTATIONAL METROLOGY
    • Publication number 20190361358
    • Publication date Nov 28, 2019
    • ASML NETHERLANDS B.V.
    • Wim Tjibbo TEL
    • G06 - COMPUTING CALCULATING COUNTING