Highland Park, NJ, US
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Rutgers, The State University of New Jersey
Yicheng Lu
H01 - BASIC ELECTRIC ELEMENTS
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Rutgers, The State University of New Jersey
Yicheng Lu
B82 - NANO-TECHNOLOGY
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Rutgers, The State University of New Jersey
Yicheng Lu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Patent Grant
Rutgers, The State University of New Jersey
Yicheng Lu
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Rutgers, The State University of New Jersey
Yicheng Lu
G11 - INFORMATION STORAGE
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Rutgers, The State University of New Jersey
Yicheng Lu
G01 - MEASURING TESTING
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Patent Grant
Rutgers, The State University of New Jersey
Yicheng Lu
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Rutgers, The State University of New Jersey
Yicheng Lu
B82 - NANO-TECHNOLOGY
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Patent Grant
Rutgers, The State University of New Jersey
Yicheng Lu
B82 - NANO-TECHNOLOGY
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Patent Grant
Rutgers, The State University of New Jersey
Yicheng Lu
B82 - NANO-TECHNOLOGY
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Rutgers The State University
Kristin Dana
G07 - CHECKING-DEVICES
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Rutgers, The State University of New Jersey
Yicheng Lu
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
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The United States of America as represented by the Secretary of the Army
Arthur Ballato
G01 - MEASURING TESTING
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The United States of America as represented by the Secretary of the Army
Arthur Ballato
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
Rutgers, The State University of New Jersey
Yicheng Lu
H01 - BASIC ELECTRIC ELEMENTS
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Rutgers, The State University of New Jersey
Yicheng Lu
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
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Rutgers, The State University of New Jersey
Yicheng Lu
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
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Patent Grant
Rutgers, The State University of New Jersey
Yicheng Lu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Patent Grant
Rutgers, The State University of New Jersey
Yicheng Lu
G01 - MEASURING TESTING
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Patent Grant
Rutgers, The State University of New Jersey
Yicheng Lu
G01 - MEASURING TESTING
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Patent Grant
Rutgers, The State University of New Jersey
Yicheng Lu
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
Rutgers, The State University of New Jersey
Jiahua Zhu
H03 - BASIC ELECTRONIC CIRCUITRY
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Michael Wraback
B82 - NANO-TECHNOLOGY
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The United States of America as represented by the Secretary of the Army
Arthur Ballato
B82 - NANO-TECHNOLOGY
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The United States of America as represented by the Secretary of the Army
John A. Kosinski
H03 - BASIC ELECTRONIC CIRCUITRY
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The United States of America as represented by the Secretary of the Army
John A. Kosinski
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
The United States of America as represented by the Secretary of the Army
Arthur Ballato
B82 - NANO-TECHNOLOGY
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
G01 - MEASURING TESTING
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
G11 - INFORMATION STORAGE
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
G01 - MEASURING TESTING
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
B82 - NANO-TECHNOLOGY
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
B82 - NANO-TECHNOLOGY
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
G01 - MEASURING TESTING
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Patent Application
Rutgers, The State University of New Jersey
Kristin Dana
G07 - CHECKING-DEVICES
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
B82 - NANO-TECHNOLOGY
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
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Patent Application
Yicheng Lu
G01 - MEASURING TESTING
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
B82 - NANO-TECHNOLOGY
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
C30 - CRYSTAL GROWTH
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Patent Application
Yicheng Lu
G01 - MEASURING TESTING
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Patent Application
Rutgers, The State University
Kristin Dana
G07 - CHECKING-DEVICES
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
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Patent Application
Rutgers, The State University of New Jersey and
Yicheng Lu
G01 - MEASURING TESTING
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
C30 - CRYSTAL GROWTH
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
C30 - CRYSTAL GROWTH
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Patent Application
Rutgers, The State University of New Jersey
Jiahua Zhu
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
Rutgers, The State University of New Jersey
Yicheng Lu
G01 - MEASURING TESTING
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Patent Application
Rutgers, The State University
Yicheng Lu
H03 - BASIC ELECTRONIC CIRCUITRY
