Yih-Chau Chen

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Taichung, TW

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Patents Grantslast 30 patents

Information Patent Grant
Short-circuit probe card, wafer test system, and fault detection me...
- Patent number 11,821,919
- Issue date Nov 21, 2023
- Windbond Electronics Corp.
- Chung-Hsuan Kan
- G01 - MEASURING TESTING
Information Patent Grant
Manual tester for testing device and method thereof
- Patent number 6,949,941
- Issue date Sep 27, 2005
- Winbond Electronics Corp.
- Yih-Chau Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SHORT-CIRCUIT PROBE CARD, WAFER TEST SYSTEM, AND FAULT DETECTION ME...
- Publication number 20210123951
- Publication date Apr 29, 2021
- WINBOND ELECTRONICS CORP.
- Chung-Hsuan KAN
- G01 - MEASURING TESTING
Information Patent Application
Manual tester for testing device and method thereof
- Publication number 20030160629
- Publication date Aug 28, 2003
- WINBOND ELECTRONICS CORP.
- Yih-Chau Chen
- G01 - MEASURING TESTING