YiKai Liang

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor die, electronic component, electronic apparatus and m...
- Patent number 12,085,976
- Issue date Sep 10, 2024
- Shanghai Biren Technology Co., Ltd
- Yikai Liang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip and chip test method
- Patent number 12,019,117
- Issue date Jun 25, 2024
- Shanghai Biren Technology Co., Ltd
- Kai Lei
- G01 - MEASURING TESTING
Information Patent Grant
Chip and chip testing method
- Patent number 11,835,595
- Issue date Dec 5, 2023
- Shanghai Biren Technology Co., Ltd
- Kai Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clock step control circuit and method thereof
- Patent number 11,381,245
- Issue date Jul 5, 2022
- Shanghai Biren Technology Co., Ltd
- Zheng Tian
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
CHIP AND CHIP TESTING METHOD
- Publication number 20230176141
- Publication date Jun 8, 2023
- Shanghai Biren Technology Co.,Ltd
- Kai LEI
- G01 - MEASURING TESTING
Information Patent Application
CHIP AND CHIP TEST METHOD
- Publication number 20230176118
- Publication date Jun 8, 2023
- Shanghai Biren Technology Co.,Ltd
- Kai LEI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DIE, ELECTRONIC COMPONENT, ELECTRONIC APPARATUS AND M...
- Publication number 20220404857
- Publication date Dec 22, 2022
- Shanghai Biren Technology Co.,Ltd
- Yikai Liang
- G06 - COMPUTING CALCULATING COUNTING