Yimei DING

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Shiojiri-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Information processing method, wearable apparatus, content reproduc...
- Patent number 10,478,703
- Issue date Nov 19, 2019
- Seiko Epson Corporation
- Yimei Ding
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error estimation method, motion analysis method, error estimation a...
- Patent number 10,288,746
- Issue date May 14, 2019
- Seiko Epson Corporation
- Yimei Ding
- G08 - SIGNALLING
Information Patent Grant
Bias estimating method, posture estimating method, bias estimating...
- Patent number 9,273,967
- Issue date Mar 1, 2016
- Seiko Epson Corporation
- Yimei Ding
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ERROR ESTIMATION METHOD, MOTION ANALYSIS METHOD, ERROR ESTIMATION A...
- Publication number 20180172842
- Publication date Jun 21, 2018
- SEIKO EPSON CORPORATION
- Yimei DING
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING METHOD, WEARABLE APPARATUS, CONTENT REPRODUC...
- Publication number 20180065022
- Publication date Mar 8, 2018
- SEIKO EPSON CORPORATION
- Yimei DING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SLEEP STATE DETERMINATION APPARATUS, SLEEP STATE DETERMINATION METH...
- Publication number 20160100792
- Publication date Apr 14, 2016
- SEIKO EPSON CORPORATION
- Yimei Ding
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
BIAS CALCULATION METHOD AND BIAS CALCULATION DEVICE
- Publication number 20150051865
- Publication date Feb 19, 2015
- Yimei Ding
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING APPARATUS AND POSITIONING METHOD
- Publication number 20120232792
- Publication date Sep 13, 2012
- SEIKO EPSON CORPORATION
- Yimei Ding
- G01 - MEASURING TESTING
Information Patent Application
BIAS ESTIMATING METHOD, POSTURE ESTIMATING METHOD, BIAS ESTIMATING...
- Publication number 20110320164
- Publication date Dec 29, 2011
- SEIKO EPSON CORPORATION
- Yimei DING
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ACQUISITION METHOD AND SIGNAL ACQUISITION APPARATUS
- Publication number 20110206093
- Publication date Aug 25, 2011
- SEIKO EPSON CORPORATION
- Shunichi Mizuochi
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ACQUISITION METHOD AND SIGNAL ACQUISITION APPARATUS
- Publication number 20110206092
- Publication date Aug 25, 2011
- SEIKO EPSON CORPORATION
- Shunichi Mizuochi
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Information processing method, wearable apparatus, content reproduc...

Error estimation method, motion analysis method, error estimation a...

Bias estimating method, posture estimating method, bias estimating...

Patents Applicationslast 30 patents

ERROR ESTIMATION METHOD, MOTION ANALYSIS METHOD, ERROR ESTIMATION A...

INFORMATION PROCESSING METHOD, WEARABLE APPARATUS, CONTENT REPRODUC...

SLEEP STATE DETERMINATION APPARATUS, SLEEP STATE DETERMINATION METH...

BIAS CALCULATION METHOD AND BIAS CALCULATION DEVICE

POSITIONING APPARATUS AND POSITIONING METHOD

BIAS ESTIMATING METHOD, POSTURE ESTIMATING METHOD, BIAS ESTIMATING...

SIGNAL ACQUISITION METHOD AND SIGNAL ACQUISITION APPARATUS

SIGNAL ACQUISITION METHOD AND SIGNAL ACQUISITION APPARATUS