TREA

Yin Fong Choi

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  • Eindhoven, NL
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Patents Grantslast 30 patents

  • Information Patent Grant

    Lithographic method
    • Patent number 8,119,333
    • Issue date Feb 21, 2012
    • ASML Netherlands B.V.
    • Eddy Cornelis Antonius Van Der Heijden
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Overlay measurement on double patterning substrate
    • Patent number 7,992,115
    • Issue date Aug 2, 2011
    • ASML Netherlands B.V.
    • Eddy Cornelis Antonius Van Der Heijden
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

  • Information Patent Application

    Lithographic Method
    • Publication number 20090148796
    • Publication date Jun 11, 2009
    • ASML NETHERLANDS B.V.
    • Eddy Cornelis Antonius VAN DER HEIJDEN
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Overlay Measurement on Double Patterning Substrate
    • Publication number 20090100391
    • Publication date Apr 16, 2009
    • ASML NETHERLANDS B.V.
    • Eddy Cornelis Antonius VAN DER HEIJDEN
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY