Yin-Ping Chern

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Chiayi County, TW

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Patents Grantslast 30 patents

Information Patent Grant
Circuit having multiple scan modes for testing
- Patent number 11,073,558
- Issue date Jul 27, 2021
- Realtek Semiconductor Corp.
- Tzung-Jin Wu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wafer testing machine and method for training artificial intelligen...
- Publication number 20210287086
- Publication date Sep 16, 2021
- REALTEK SEMICONDUCTOR CORPORATION
- YIN-PING CHERN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST PATTERN GENERATING METHOD, TEST PATTERN GENERATING DEVICE AND...
- Publication number 20210132147
- Publication date May 6, 2021
- Realtek Semiconductor Corp.
- Ying-Yen Chen
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT APPLIED TO MULTIPLE SCAN MODES FOR TESTING
- Publication number 20200182933
- Publication date Jun 11, 2020
- Realtek Semiconductor Corp.
- Tzung-Jin Wu
- G01 - MEASURING TESTING