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Yina Wang
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San Jose, CA, US
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last 30 patents
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Patent Grant
Methods and systems for determining an ideal detector gain
Patent number
12,298,219
Issue date
May 13, 2025
Becton, Dickinson and Company
Wenyu Bai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
APPARATUS AND METHOD FOR EXTENDED DEPTH OF FIELD
Publication number
20250164398
Publication date
May 22, 2025
Illumina, Inc.
Jeffrey GAU
G01 - MEASURING TESTING
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Patent Application
AI-DRIVEN SIGNAL ENHANCEMENT OF SEQUENCING IMAGES
Publication number
20230296516
Publication date
Sep 21, 2023
Illumina, Inc.
Anindita Dutta
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Methods and Systems for Determining an Ideal Detector Gain
Publication number
20230296493
Publication date
Sep 21, 2023
Becton, Dickinson and Company
Wenyu Bai
G01 - MEASURING TESTING
Information
Patent Application
AI-DRIVEN ENHANCEMENT OF MOTION BLURRED SEQUENCING IMAGES
Publication number
20230260096
Publication date
Aug 17, 2023
Illumina, Inc.
Simon Prince
G06 - COMPUTING CALCULATING COUNTING