Ying-Shiou Lin

Person

Chiayi, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Metal oxide semiconductor device having mitigated threshold voltage...
- Patent number 10,355,088
- Issue date Jul 16, 2019
- Richtek Technology Corporation
- Tsung-Yi Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor overlapped PN structure and manufacturing method thereof
- Patent number 8,710,633
- Issue date Apr 29, 2014
- Richtek Technology Corporation
- Tsung-Yi Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor overlapped PN structure and manufacturing method thereof
- Patent number 8,524,586
- Issue date Sep 3, 2013
- Richtek Technology Corporation
- Tsung-Yi Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling impurity density distribution in semiconduct...
- Patent number 8,525,258
- Issue date Sep 3, 2013
- Richtek Technology Corporation, R.O.C.
- Tsung-Yi Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detecting method and device for saving electrical power consumption...
- Patent number 7,860,537
- Issue date Dec 28, 2010
- Mitac International Corp.
- Ying-Tsang Lin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
NATIVE NMOS DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20240105844
- Publication date Mar 28, 2024
- RICHTEK TECHNOLOGY CORPORATION
- Ying-Shiou Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH VOLTAGE DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20220165880
- Publication date May 26, 2022
- RICHTEK TECHNOLOGY CORPORATION
- Tsung-Yi Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH VOLTAGE DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20200111906
- Publication date Apr 9, 2020
- RICHTEK TECHNOLOGY CORPORATION
- Tsung-Yi Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL OXIDE SEMICONDUCTOR DEVICE HAVING MITIGATED THRESHOLD VOLTAGE...
- Publication number 20180190773
- Publication date Jul 5, 2018
- Richtek Technology Corporation
- Tsung-Yi Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Overlapped PN Structure and Manufacturing Method Thereof
- Publication number 20130256846
- Publication date Oct 3, 2013
- Richtek Technology Corporation
- Tsung-Yi Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR OVERLAPPED PN STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20120267767
- Publication date Oct 25, 2012
- Richtek Technology Corporation, R.O.C.
- TSUNG-YI HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CONTROLLING IMPURITY DENSITY DISTRIBUTION IN SEMICONDUCT...
- Publication number 20110309443
- Publication date Dec 22, 2011
- Richtek Technology Corporation, R.O.C.
- Tsung-Yi Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTING METHOD AND DEVICE FOR SAVING ELECTRICAL POWER CONSUMPTION...
- Publication number 20090111421
- Publication date Apr 30, 2009
- Mitac International Corp.
- Ying-Tsang LIN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Ying-Shiou Lin

Person

Patents Grantslast 30 patents

Metal oxide semiconductor device having mitigated threshold voltage...

Semiconductor overlapped PN structure and manufacturing method thereof

Semiconductor overlapped PN structure and manufacturing method thereof

Method for controlling impurity density distribution in semiconduct...

Detecting method and device for saving electrical power consumption...

Patents Applicationslast 30 patents

NATIVE NMOS DEVICE AND MANUFACTURING METHOD THEREOF

HIGH VOLTAGE DEVICE AND MANUFACTURING METHOD THEREOF

HIGH VOLTAGE DEVICE AND MANUFACTURING METHOD THEREOF

METAL OXIDE SEMICONDUCTOR DEVICE HAVING MITIGATED THRESHOLD VOLTAGE...

Semiconductor Overlapped PN Structure and Manufacturing Method Thereof

SEMICONDUCTOR OVERLAPPED PN STRUCTURE AND MANUFACTURING METHOD THEREOF

METHOD FOR CONTROLLING IMPURITY DENSITY DISTRIBUTION IN SEMICONDUCT...

DETECTING METHOD AND DEVICE FOR SAVING ELECTRICAL POWER CONSUMPTION...