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Hefei, Anhui, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Device and method for real-time measuring the spectrum of airborne...
Patent number
11,960,030
Issue date
Apr 16, 2024
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Dong Liu
G01 - MEASURING TESTING
Information
Patent Grant
System and method for detecting centroid of complementary single pixel
Patent number
11,940,348
Issue date
Mar 26, 2024
Hefei Institutes of Physical Science, Chinese Academy of Sciences
Dongfeng Shi
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring transmittance curve of Fabry-Perot using frequ...
Patent number
11,874,169
Issue date
Jan 16, 2024
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Yingjian Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method for radiation calibration of airborne hyperspectral imaging...
Patent number
11,867,846
Issue date
Jan 9, 2024
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Dong Liu
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring transmittance curve of Fabry-Parot...
Patent number
11,313,760
Issue date
Apr 26, 2022
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Dong Liu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR DETECTING CENTROID OF COMPLEMENTARY SINGLE PIXEL
Publication number
20240094086
Publication date
Mar 21, 2024
Hefei Institutes of Physical Science, Chinese Academy of Sciences
Dongfeng SHI
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR MEASURING TRANSMITTANCE CURVE OF FABRY-PEROT USING FREQU...
Publication number
20230152153
Publication date
May 18, 2023
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Yingjian WANG
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC DETECTION AND ACQUISITION SYSTEM AND CENTROID DETECTI...
Publication number
20220365211
Publication date
Nov 17, 2022
Hefei Institutes of Physical Science, Chinese Academy of Sciences
Yingjian WANG
G01 - MEASURING TESTING
Information
Patent Application
Method for Radiation Calibration of Airborne Hyperspectral Imaging...
Publication number
20220146651
Publication date
May 12, 2022
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Dong LIU
G01 - MEASURING TESTING
Information
Patent Application
Device and method for real-time measuring the spectrum of airborne...
Publication number
20220146641
Publication date
May 12, 2022
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Dong LIU
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR MEASURING TRANSMITTANCE CURVE OF FABRY-PAROT...
Publication number
20210364383
Publication date
Nov 25, 2021
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Dong LIU
G01 - MEASURING TESTING