Yingshuai DU

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor detector and method for packaging the same
- Patent number 10,670,743
- Issue date Jun 2, 2020
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses for processing signals for a plurality of energy region...
- Patent number 10,663,607
- Issue date May 26, 2020
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor detector
- Patent number 10,388,818
- Issue date Aug 20, 2019
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor detector
- Patent number 10,295,679
- Issue date May 21, 2019
- Nuctech Company Limited
- Lan Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor detector
- Patent number 10,101,473
- Issue date Oct 16, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for processing signals of semiconductor detector
- Patent number 9,835,739
- Issue date Dec 5, 2017
- Tsinghua University
- Lan Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
AERIAL CDZNTE INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20180284302
- Publication date Oct 4, 2018
- Nuctech Company Limited
- Lan ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DETECTOR AND METHOD FOR PACKAGING THE SAME
- Publication number 20180059265
- Publication date Mar 1, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DETECTOR
- Publication number 20180059261
- Publication date Mar 1, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DETECTOR
- Publication number 20180059262
- Publication date Mar 1, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DETECTOR
- Publication number 20180062021
- Publication date Mar 1, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES FOR PROCESSING SIGNALS FOR A PLURALITY OF ENERGY REGION...
- Publication number 20180059269
- Publication date Mar 1, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR, AND DETECTING SYSTEM AND METHOD FOR DIVIDING ENERGY REGIO...
- Publication number 20180059264
- Publication date Mar 1, 2018
- Nuctech Company Limited
- Lan Zhang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING SIGNALS OF SEMICONDUCTOR DETECTOR
- Publication number 20160018537
- Publication date Jan 21, 2016
- TSINGHUA UNIVERSITY
- Lan ZHANG
- G01 - MEASURING TESTING

Yingshuai DU

Person

Patents Grantslast 30 patents

Semiconductor detector and method for packaging the same

Apparatuses for processing signals for a plurality of energy region...

Semiconductor detector

Semiconductor detector

Semiconductor detector

Method and apparatus for processing signals of semiconductor detector

Patents Applicationslast 30 patents

AERIAL CDZNTE INSPECTION SYSTEM AND INSPECTION METHOD

SEMICONDUCTOR DETECTOR AND METHOD FOR PACKAGING THE SAME

SEMICONDUCTOR DETECTOR

SEMICONDUCTOR DETECTOR

SEMICONDUCTOR DETECTOR

APPARATUSES FOR PROCESSING SIGNALS FOR A PLURALITY OF ENERGY REGION...

DETECTOR, AND DETECTING SYSTEM AND METHOD FOR DIVIDING ENERGY REGIO...

METHOD AND APPARATUS FOR PROCESSING SIGNALS OF SEMICONDUCTOR DETECTOR