Yiwu Ding

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Danville, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Imaging-based height measurement based on known geometric information
- Patent number 10,473,454
- Issue date Nov 12, 2019
- KLA-Tencor Corporation
- Yiwu Ding
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection on transparent or translucent wafers
- Patent number 10,402,963
- Issue date Sep 3, 2019
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTOLUMINESCENCE FOR SEMICONDUCTOR YIELD RELATED APPLICATIONS
- Publication number 20240044799
- Publication date Feb 8, 2024
- KLA Corporation
- James Xu
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION ON TRANSPARENT OR TRANSLUCENT WAFERS
- Publication number 20190066284
- Publication date Feb 28, 2019
- KLA-Tencor Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING