Ynhi Le

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Gresham, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
In-situ metrology system and method for monitoring metalization and...
- Patent number 7,414,721
- Issue date Aug 19, 2008
- LSI Corporation
- Agajan Suvkhanov
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication of trenches with multiple depths on the same substrate
- Patent number 7,189,628
- Issue date Mar 13, 2007
- LSI Logic Corporation
- Mohammad R. Mirbedini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of trenches with multiple depths on the same substrate
- Patent number 6,864,152
- Issue date Mar 8, 2005
- LSI Logic Corporation
- Mohammad R. Mirbedini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System to reduce particulate contamination
- Patent number 6,355,577
- Issue date Mar 12, 2002
- LSI Logice Corporation
- Steven E. Reder
- C30 - CRYSTAL GROWTH