Yo Yamamoto

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic sample preparation apparatus
- Patent number 11,835,438
- Issue date Dec 5, 2023
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic sample preparation apparatus and automatic sample prepara...
- Patent number 11,073,453
- Issue date Jul 27, 2021
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic sample preparation apparatus
- Patent number 10,677,697
- Issue date Jun 9, 2020
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,236,159
- Issue date Mar 19, 2019
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic sample preparation apparatus
- Patent number 10,088,401
- Issue date Oct 2, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,620,333
- Issue date Apr 11, 2017
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus having needle probe that tracks tar...
- Patent number 9,275,827
- Issue date Mar 1, 2016
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus having improved needle movement con...
- Patent number 9,218,937
- Issue date Dec 22, 2015
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 9,214,316
- Issue date Dec 15, 2015
- Hitachi High-Tech Science Corporation
- Yo Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 9,024,280
- Issue date May 5, 2015
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and method of adjusting charged par...
- Patent number 8,698,105
- Issue date Apr 15, 2014
- SII NanoTechnology
- Takashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 8,642,980
- Issue date Feb 4, 2014
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample processing and observing method
- Patent number 8,274,049
- Issue date Sep 25, 2012
- SII NanoTechnology Inc.
- Keiichi Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method adjusting axis of aperture
- Patent number 8,124,932
- Issue date Feb 28, 2012
- SII NanoTechnology Inc.
- Takashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus, method of processing a s...
- Patent number 7,973,280
- Issue date Jul 5, 2011
- SII NanoTechnology Inc.
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Composite charged-particle beam system
- Patent number 7,718,981
- Issue date May 18, 2010
- SII NanoTechnology Inc.
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing apparatus using focused charged particle beam
- Patent number 7,518,125
- Issue date Apr 14, 2009
- SII NanoTechnology Inc.
- Yo Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,442,942
- Issue date Oct 28, 2008
- SII NanoTechnology Inc.
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Micro-sample pick-up apparatus and micro-sample pick-up method
- Patent number 7,067,823
- Issue date Jun 27, 2006
- SII NanoTechnology Inc.
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
EPL mask processing method and device thereof
- Patent number 7,060,397
- Issue date Jun 13, 2006
- SII NanoTechnology Inc.
- Yo Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS
- Publication number 20210341362
- Publication date Nov 4, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS AND AUTOMATIC SAMPLE PREPARA...
- Publication number 20200355589
- Publication date Nov 12, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS
- Publication number 20200278281
- Publication date Sep 3, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS
- Publication number 20190025167
- Publication date Jan 24, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20170178858
- Publication date Jun 22, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS
- Publication number 20170122852
- Publication date May 4, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20160064187
- Publication date Mar 3, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150228451
- Publication date Aug 13, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150228450
- Publication date Aug 13, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130248735
- Publication date Sep 26, 2013
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130082176
- Publication date Apr 4, 2013
- Yo YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130075606
- Publication date Mar 28, 2013
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
Sample processing and observing method
- Publication number 20110226948
- Publication date Sep 22, 2011
- Keiichi Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD OF ADJUSTING CHARGED PAR...
- Publication number 20100116984
- Publication date May 13, 2010
- Takashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD ADJUSTING AXIS OF APERTURE
- Publication number 20090242757
- Publication date Oct 1, 2009
- Takashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Composite charged particle beam apparatus, method of processing a s...
- Publication number 20090206254
- Publication date Aug 20, 2009
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE CHARGED-PARTICLE BEAM SYSTEM
- Publication number 20080315088
- Publication date Dec 25, 2008
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20070045560
- Publication date Mar 1, 2007
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Processing apparatus using focused charged particle beam
- Publication number 20070040128
- Publication date Feb 22, 2007
- Yo Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Micro-sample pick-up apparatus and micro-sample pick-up method
- Publication number 20040246465
- Publication date Dec 9, 2004
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
EPL mask processing method and device thereof
- Publication number 20030232258
- Publication date Dec 18, 2003
- Yo Yamamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Yo Yamamoto

Person

Patents Grantslast 30 patents

Automatic sample preparation apparatus

Automatic sample preparation apparatus and automatic sample prepara...

Automatic sample preparation apparatus

Charged particle beam apparatus

Automatic sample preparation apparatus

Charged particle beam apparatus

Charged particle beam apparatus having needle probe that tracks tar...

Charged particle beam apparatus having improved needle movement con...

Composite charged particle beam apparatus

Composite charged particle beam apparatus

Charged particle beam apparatus and method of adjusting charged par...

Composite charged particle beam apparatus

Sample processing and observing method

Charged particle beam apparatus and method adjusting axis of aperture

Composite charged particle beam apparatus, method of processing a s...

Composite charged-particle beam system

Processing apparatus using focused charged particle beam

Charged particle beam apparatus

Micro-sample pick-up apparatus and micro-sample pick-up method

EPL mask processing method and device thereof

Patents Applicationslast 30 patents

AUTOMATIC SAMPLE PREPARATION APPARATUS

AUTOMATIC SAMPLE PREPARATION APPARATUS AND AUTOMATIC SAMPLE PREPARA...

AUTOMATIC SAMPLE PREPARATION APPARATUS

AUTOMATIC SAMPLE PREPARATION APPARATUS

CHARGED PARTICLE BEAM APPARATUS

AUTOMATIC SAMPLE PREPARATION APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

Sample processing and observing method

CHARGED PARTICLE BEAM APPARATUS AND METHOD OF ADJUSTING CHARGED PAR...

CHARGED PARTICLE BEAM APPARATUS AND METHOD ADJUSTING AXIS OF APERTURE

Composite charged particle beam apparatus, method of processing a s...

COMPOSITE CHARGED-PARTICLE BEAM SYSTEM

Charged particle beam apparatus

Processing apparatus using focused charged particle beam

Micro-sample pick-up apparatus and micro-sample pick-up method

EPL mask processing method and device thereof