Yoav Berlatzky

Person

DN Lachish South, IL

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for defect detection using multi-spot scanning
- Patent number 11,385,188
- Issue date Jul 12, 2022
- APPLIED MATERIAL ISRAEL, LTD.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Wavefront sensor and method of using it
- Patent number 11,293,806
- Issue date Apr 5, 2022
- PXE COMPUTATIONAL IMAGIMG LTD
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 11,029,258
- Issue date Jun 8, 2021
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and method for measurements of samples
- Patent number 10,739,277
- Issue date Aug 11, 2020
- Nova Measuring Instruments Ltd.
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Grant
System and method for defect detection using multi-spot scanning
- Patent number 10,386,311
- Issue date Aug 20, 2019
- Applied Materials Israel, Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 10,161,885
- Issue date Dec 25, 2018
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
System and method for defect detection using multi-spot scanning
- Patent number 9,810,643
- Issue date Nov 7, 2017
- Applied Materials Israel Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Optical element for spatial beam shaping
- Patent number 9,664,907
- Issue date May 30, 2017
- Applied Materials Israel Ltd.
- Yoav Berlatzky
- G02 - OPTICS
Information Patent Grant
Inspection having a segmented pupil
- Patent number 9,354,212
- Issue date May 31, 2016
- Applied Materials Israel Ltd.
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and method for inspection of patterned samples
- Patent number 8,614,790
- Issue date Dec 24, 2013
- Applied Materials Israel, Ltd.
- Yoav Berlatzky
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR DIGITAL OPTICAL ABERRATION CORRECTION AND SPE...
- Publication number 20230177655
- Publication date Jun 8, 2023
- PXE COMPUTATIONAL IMAGING LTD
- Yoav Berlatzky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR OPTICAL IMAGING AND MEASUREMENT OF OBJECTS
- Publication number 20230029930
- Publication date Feb 2, 2023
- PXE COMPUTATIONAL IMAGING LTD
- Yoav Berlatzky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20210364451
- Publication date Nov 25, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
WAVEFRONT SENSOR AND METHOD OF USING IT
- Publication number 20200278257
- Publication date Sep 3, 2020
- PXE COMPUTATIONAL IMAGING LTD
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20190154594
- Publication date May 23, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND METHOD FOR MEASUREMENTS OF SAMPLES
- Publication number 20190128823
- Publication date May 2, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Yoav BERLATZKY
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20170016835
- Publication date Jan 19, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT FOR SPATIAL BEAM SHAPING
- Publication number 20160018660
- Publication date Jan 21, 2016
- APPLIED MATERIALS ISRAEL, LTD.
- Yoav Berlatzky
- G02 - OPTICS
Information Patent Application
INSPECTION HAVING A SEGMENTED PUPIL
- Publication number 20150193926
- Publication date Jul 9, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND METHOD FOR INSPECTION OF PATTERNED SAMPLES
- Publication number 20130148114
- Publication date Jun 13, 2013
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND METHOD FOR INSPECTION OF PATTERNED SAMPLES
- Publication number 20130148115
- Publication date Jun 13, 2013
- Yoav Berlatzky
- G01 - MEASURING TESTING

Yoav Berlatzky

Person

Patents Grantslast 30 patents

System and method for defect detection using multi-spot scanning

Wavefront sensor and method of using it

Optical phase measurement method and system

Optical system and method for measurements of samples

System and method for defect detection using multi-spot scanning

Optical phase measurement method and system

System and method for defect detection using multi-spot scanning

Optical element for spatial beam shaping

Inspection having a segmented pupil

Optical system and method for inspection of patterned samples

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR DIGITAL OPTICAL ABERRATION CORRECTION AND SPE...

SYSTEM AND METHOD FOR OPTICAL IMAGING AND MEASUREMENT OF OBJECTS

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

WAVEFRONT SENSOR AND METHOD OF USING IT

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

OPTICAL SYSTEM AND METHOD FOR MEASUREMENTS OF SAMPLES

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

OPTICAL ELEMENT FOR SPATIAL BEAM SHAPING

INSPECTION HAVING A SEGMENTED PUPIL

OPTICAL SYSTEM AND METHOD FOR INSPECTION OF PATTERNED SAMPLES

OPTICAL SYSTEM AND METHOD FOR INSPECTION OF PATTERNED SAMPLES