Yoav Grauer

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Multi-resolution overlay metrology targets
- Patent number 11,726,410
- Issue date Aug 15, 2023
- KLA Corporation
- Eitan Hajaj
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MULTI-RESOLUTION OVERLAY METROLOGY TARGETS
- Publication number 20220334501
- Publication date Oct 20, 2022
- KLA Corporation
- Eitan Hajaj
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL METROLOGY UTILIZING SHORT-WAVE INFRARED WAVELENGTHS
- Publication number 20220291143
- Publication date Sep 15, 2022
- Amnon Manassen
- G01 - MEASURING TESTING