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Ramat Gan, IL
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last 30 patents
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Patent Grant
Method and system for thickness measurements of thin conductive layers
Patent number
6,815,947
Issue date
Nov 9, 2004
Nova Measuring Instruments Ltd.
David Scheiner
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method and system for thickness measurements of thin conductive layers
Publication number
20040138838
Publication date
Jul 15, 2004
David Scheiner
G01 - MEASURING TESTING