Yogesh M Pai

Person

Bengaluru, IN

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for computing direct quadrature zero resultant dr...
- Patent number 12,092,693
- Issue date Sep 17, 2024
- Tektronix, Inc.
- Parjanya Adiga
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Test and measurement instrument for determining magnetic core losses
- Patent number 12,020,855
- Issue date Jun 25, 2024
- Tektronix, Inc.
- Shubha B
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POW...
- Publication number 20240353470
- Publication date Oct 24, 2024
- Tektronix, Inc.
- Niranjan R. Hegde
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING OUTPUT CHARGE OF WIDE BANDGAP...
- Publication number 20240044968
- Publication date Feb 8, 2024
- Tektronix, Inc.
- Vivek Shivaram
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC VERTICAL SIGNAL CALIBRATION IN A TEST AND MEASUREMENT INSTR...
- Publication number 20240036143
- Publication date Feb 1, 2024
- Tektronix, Inc.
- Shubha B
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DE-SKEW SYSTEM AND METHOD FOR HIGH VOLTAGE SEMICONDUCTORS
- Publication number 20240027513
- Publication date Jan 25, 2024
- Tektronix, Inc.
- Vivek Shivaram
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING POWER SUPPLY INDUCED JITTER
- Publication number 20230251699
- Publication date Aug 10, 2023
- Tektronix, Inc.
- Madhusudan Acharya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REVERSE RECOVERY MEASUREMENTS AND PLOTS
- Publication number 20230133047
- Publication date May 4, 2023
- Tektronix, Inc.
- Vivek Shivaram
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE WIDE BANDGAP DOUBLE PULSE TESTING METHODOLOGY
- Publication number 20230133743
- Publication date May 4, 2023
- Tektronix, Inc.
- Vivek Shivaram
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR COMPUTING DIRECT QUADRATURE ZERO RESULTANT DR...
- Publication number 20220413051
- Publication date Dec 29, 2022
- Tektronix, Inc.
- Parjanya Adiga
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT FOR DETERMINING MAGNETIC CORE LOSSES
- Publication number 20210358685
- Publication date Nov 18, 2021
- Tektronix, Inc.
- Shubha B
- G01 - MEASURING TESTING

Yogesh M Pai

Person

Patents Grantslast 30 patents

System and method for computing direct quadrature zero resultant dr...

Test and measurement instrument for determining magnetic core losses

Patents Applicationslast 30 patents

SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POW...

METHOD AND APPARATUS FOR DETERMINING OUTPUT CHARGE OF WIDE BANDGAP...

DYNAMIC VERTICAL SIGNAL CALIBRATION IN A TEST AND MEASUREMENT INSTR...

AUTOMATED DE-SKEW SYSTEM AND METHOD FOR HIGH VOLTAGE SEMICONDUCTORS

METHOD AND APPARATUS FOR MEASURING POWER SUPPLY INDUCED JITTER

REVERSE RECOVERY MEASUREMENTS AND PLOTS

FLEXIBLE WIDE BANDGAP DOUBLE PULSE TESTING METHODOLOGY

SYSTEM AND METHOD FOR COMPUTING DIRECT QUADRATURE ZERO RESULTANT DR...

TEST AND MEASUREMENT INSTRUMENT FOR DETERMINING MAGNETIC CORE LOSSES