Yohannes Desta

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Arcadia, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for massively parallel multi-wafer test
- Patent number 9,335,347
- Issue date May 10, 2016
- Advantest Corporation
- John W. Andberg
- G01 - MEASURING TESTING
Information Patent Grant
Laterally driven probes for semiconductor testing
- Patent number 9,250,290
- Issue date Feb 2, 2016
- Advantest Corporation
- Lakshmikanth Namburi
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a microelectronic contactor assembly, and methods of...
- Patent number 8,901,950
- Issue date Dec 2, 2014
- Advantest America, Inc.
- Yohannes Desta
- G01 - MEASURING TESTING
Information Patent Grant
Microelectronic contactor assembly, structures thereof, and methods...
- Patent number 8,305,101
- Issue date Nov 6, 2012
- Advantest America, Inc.
- Yohannes Desta
- G01 - MEASURING TESTING
Information Patent Grant
Probecard system and method
- Patent number 8,278,956
- Issue date Oct 2, 2012
- Advantest America, Inc
- Matt Losey
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a microelectronic contactor assembly, the probe head...
- Patent number 8,232,818
- Issue date Jul 31, 2012
- Advantest America, Inc.
- Yohannes Desta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST
- Publication number 20140070828
- Publication date Mar 13, 2014
- John W. Andberg
- G01 - MEASURING TESTING
Information Patent Application
LATERALLY DRIVEN PROBES FOR SEMICONDUCTOR TESTING
- Publication number 20130285688
- Publication date Oct 31, 2013
- Lakshmikanth NAMBURI
- G01 - MEASURING TESTING
Information Patent Application
Probecard System and Method
- Publication number 20110248735
- Publication date Oct 13, 2011
- TOUCHDOWN TECHNOLOGIES, INC.
- Matt Losey
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, THE PROBE HEAD...
- Publication number 20100237889
- Publication date Sep 23, 2010
- TOUCHDOWN TECHNOLOGIES, INC.
- Yohannes Desta
- G01 - MEASURING TESTING
Information Patent Application
MICROELECTRONIC CONTACTOR ASSEMBLY, STRUCTURES THEREOF, AND METHODS...
- Publication number 20100237887
- Publication date Sep 23, 2010
- TOUCHDOWN TECHNOLOGIES, INC.
- Yohannes Desta
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, AND METHODS OF...
- Publication number 20100237888
- Publication date Sep 23, 2010
- TOUCHDOWN TECHNOLOGIES, INC.
- Yohannes Desta
- G01 - MEASURING TESTING