Yohei Asakawa

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection data analysis program, inspection tools, review apparatu...
- Patent number 7,421,357
- Issue date Sep 2, 2008
- Hitachi High-Technologies Corporation
- Makoto Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection condition setting program, inspection device and inspect...
- Patent number 6,928,375
- Issue date Aug 9, 2005
- Hitachi High-Technologies Corporation
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Grant
Sintered body and electrode, method for surface densitication of th...
- Patent number 6,753,494
- Issue date Jun 22, 2004
- Hitachi, Ltd.
- Yohei Asakawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Inspection condition setting program, inspection device and inspect...
- Publication number 20050195396
- Publication date Sep 8, 2005
- Hitachi High-Technologies Corporation
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analysis program, inspection tools, review apparatu...
- Publication number 20050021268
- Publication date Jan 27, 2005
- Makoto Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection condition setting program, inspection device and inspect...
- Publication number 20030195712
- Publication date Oct 16, 2003
- Hitachi High-Technologies Corporation
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Application
Sintered body and electrode, method for surface densitication of th...
- Publication number 20030015500
- Publication date Jan 23, 2003
- Yohei Asakawa
- H01 - BASIC ELECTRIC ELEMENTS