Yohei MINEKAWA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspecting system and defect inspecting method
- Patent number 12,154,264
- Issue date Nov 26, 2024
- HITACHI HIGH-TECH CORPORATION
- Minoru Harada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer observation apparatus and wafer observation method
- Patent number 11,670,528
- Issue date Jun 6, 2023
- HITACHI HIGH-TECH CORPORATION
- Naoaki Kondo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 11,501,950
- Issue date Nov 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Yohei Minekawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect observation device
- Patent number 11,177,111
- Issue date Nov 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Akira Ito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect observation system and defect observation method for semicon...
- Patent number 10,971,325
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Minoru Harada
- G01 - MEASURING TESTING
Information Patent Grant
Defect observation device
- Patent number 10,770,260
- Issue date Sep 8, 2020
- Hitachi High-Technologies Corporation
- Yuko Otani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect observation apparatus
- Patent number 10,593,062
- Issue date Mar 17, 2020
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Defect reviewing method and device
- Patent number 10,436,576
- Issue date Oct 8, 2019
- Hitachi High-Technologies Corporation
- Yohei Minekawa
- G01 - MEASURING TESTING
Information Patent Grant
Defect quantification method, defect quantification device, and def...
- Patent number 10,297,021
- Issue date May 21, 2019
- Hitachi High-Technologies Corporation
- Yohei Minekawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect classification apparatus and defect classification method
- Patent number 10,203,851
- Issue date Feb 12, 2019
- Hitachi High-Technologies Corporation
- Yohei Minekawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect image classification apparatus
- Patent number 10,074,511
- Issue date Sep 11, 2018
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect classification method, and defect classification system
- Patent number 9,401,015
- Issue date Jul 26, 2016
- Hitachi High-Technologies Corporation
- Yohei Minekawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reviewing defect
- Patent number 9,342,879
- Issue date May 17, 2016
- Hitachi Hich-Technologies Corporation
- Yohei Minekawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for classifying defects and method for adjusting classification
- Patent number 8,892,494
- Issue date Nov 18, 2014
- Hitachi High-Technologies Corporation
- Makoto Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect observation method and defect observation device
- Patent number 8,824,773
- Issue date Sep 2, 2014
- Hitachi High-Technologies Corporation
- Yohei Minekawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TRAINING METHOD AND DEVICE FOR MACHINE LEARNING MODEL
- Publication number 20240327775
- Publication date Oct 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Mitsuji IKEDA
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Defect Classification Device and Defect Classification Program
- Publication number 20240127421
- Publication date Apr 18, 2024
- Hitachi High-Tech Corporation
- Yohei MINEKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection System and Non-Transitory Computer-Readable Medium
- Publication number 20240127417
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Takehiro HIRAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING SYSTEM AND MACHINE LEARNING METHOD
- Publication number 20230229965
- Publication date Jul 20, 2023
- HITACHI HIGH-TECH CORPORATION
- Masayoshi ISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTING SYSTEM AND DEFECT INSPECTING METHOD
- Publication number 20230052350
- Publication date Feb 16, 2023
- HITACHI HIGH-TECH CORPORATION
- Minoru HARADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE OBSERVATION SYSTEM AND IMAGE PROCESSING METHOD
- Publication number 20230005123
- Publication date Jan 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Naoaki KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE OBSERVATION DEVICE AND METHOD
- Publication number 20220405905
- Publication date Dec 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Yuki Doi
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20210391140
- Publication date Dec 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei MINEKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER OBSERVATION APPARATUS AND WAFER OBSERVATION METHOD
- Publication number 20200411345
- Publication date Dec 31, 2020
- HITACHI HIGH-TECH CORPORATION
- Naoaki Kondo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT OBSERVATION DEVICE
- Publication number 20200335300
- Publication date Oct 22, 2020
- HITACHI HIGH-TECH CORPORATION
- Akira ITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT OBSERVATION SYSTEM AND DEFECT OBSERVATION METHOD FOR SEMICON...
- Publication number 20200083017
- Publication date Mar 12, 2020
- Hitachi High-Technologies Corporation
- Minoru HARADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT OBSERVATION DEVICE
- Publication number 20190237296
- Publication date Aug 1, 2019
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT QUANTIFICATION METHOD, DEFECT QUANTIFICATION DEVICE, AND DEF...
- Publication number 20170323435
- Publication date Nov 9, 2017
- Hitachi High-Technologies Corporation
- Yohei MINEKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT OBSERVATION APPARATUS
- Publication number 20170249753
- Publication date Aug 31, 2017
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G02 - OPTICS
Information Patent Application
DEFECT REVIEWING METHOD AND DEVICE
- Publication number 20170082425
- Publication date Mar 23, 2017
- Hitachi High-Technologies Corporation
- Yohei MINEKAWA
- G02 - OPTICS
Information Patent Application
Defect Image Classification Apparatus
- Publication number 20160358746
- Publication date Dec 8, 2016
- Hitachi High-Technologies Corporation
- Takehiro HIRAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUI, CLASSIFICATION APPARATUS, CLASSIFICATION METHOD, PROGRAM, AND...
- Publication number 20140331173
- Publication date Nov 6, 2014
- Yohei Minekawa
- G02 - OPTICS
Information Patent Application
Method and Apparatus for Reviewing Defect
- Publication number 20140219546
- Publication date Aug 7, 2014
- Hitachi High-Technologies Corporation
- Yohei Minekawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT CLASSIFICATION METHOD, AND DEFECT CLASSIFICATION SYSTEM
- Publication number 20140072204
- Publication date Mar 13, 2014
- Hitachi High-Technologies Corporation
- Yohei Minekawa
- G01 - MEASURING TESTING
Information Patent Application
DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION DEVICE
- Publication number 20130140457
- Publication date Jun 6, 2013
- Yohei Minekawa
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR CLASSIFYING DEFECTS AND METHOD FOR ADJUSTING CLASSIFICATION
- Publication number 20120117010
- Publication date May 10, 2012
- Makoto Ono
- G06 - COMPUTING CALCULATING COUNTING

Yohei MINEKAWA

Person

Patents Grantslast 30 patents

Defect inspecting system and defect inspecting method

Wafer observation apparatus and wafer observation method

Charged particle beam device

Defect observation device

Defect observation system and defect observation method for semicon...

Defect observation device

Defect observation apparatus

Defect reviewing method and device

Defect quantification method, defect quantification device, and def...

Defect classification apparatus and defect classification method

Defect image classification apparatus

Defect classification method, and defect classification system

Method and apparatus for reviewing defect

Device for classifying defects and method for adjusting classification

Defect observation method and defect observation device

Patents Applicationslast 30 patents

TRAINING METHOD AND DEVICE FOR MACHINE LEARNING MODEL

Defect Classification Device and Defect Classification Program

Inspection System and Non-Transitory Computer-Readable Medium

MACHINE LEARNING SYSTEM AND MACHINE LEARNING METHOD

DEFECT INSPECTING SYSTEM AND DEFECT INSPECTING METHOD

SAMPLE OBSERVATION SYSTEM AND IMAGE PROCESSING METHOD

SAMPLE OBSERVATION DEVICE AND METHOD

Charged Particle Beam Device

WAFER OBSERVATION APPARATUS AND WAFER OBSERVATION METHOD

DEFECT OBSERVATION DEVICE

DEFECT OBSERVATION SYSTEM AND DEFECT OBSERVATION METHOD FOR SEMICON...

DEFECT OBSERVATION DEVICE

DEFECT QUANTIFICATION METHOD, DEFECT QUANTIFICATION DEVICE, AND DEF...

DEFECT OBSERVATION APPARATUS

DEFECT REVIEWING METHOD AND DEVICE

Defect Image Classification Apparatus

GUI, CLASSIFICATION APPARATUS, CLASSIFICATION METHOD, PROGRAM, AND...

Method and Apparatus for Reviewing Defect

DEFECT CLASSIFICATION METHOD, AND DEFECT CLASSIFICATION SYSTEM

DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION DEVICE

DEVICE FOR CLASSIFYING DEFECTS AND METHOD FOR ADJUSTING CLASSIFICATION