Yohei Murayama

Person

Kawasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Photocurable composition, method for forming a pattern, and method...
- Patent number 10,535,519
- Issue date Jan 14, 2020
- Canon Kabushiki Kaisha
- Yohei Murayama
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Information processing device to process spectral information, and...
- Patent number 10,184,885
- Issue date Jan 22, 2019
- Canon Kabushiki Kaisha
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Grant
Photocured product and method for producing the same
- Patent number 9,704,710
- Issue date Jul 11, 2017
- Canon Kabushiki Kaisha
- Yohei Murayama
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Mass spectrometer and mass image analyzing system
- Patent number 9,627,177
- Issue date Apr 18, 2017
- Canon Kabushiki Kaisha
- Naofumi Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for treating living samples and analyzing the same
- Patent number 9,086,404
- Issue date Jul 21, 2015
- Canon Kabushiki Kaisha
- Manabu Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method for pre-treating specimen and method for analyzing specimen
- Patent number 8,986,943
- Issue date Mar 24, 2015
- Canon Kabushiki Kaisha
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Grant
Biological tissue processing substrate for fixing proteins or prote...
- Patent number 8,962,302
- Issue date Feb 24, 2015
- Canon Kabushiki Kaisha
- Kazuhiro Ban
- G01 - MEASURING TESTING
Information Patent Grant
Ion group irradiation device and secondary ion mass spectrometer
- Patent number 8,963,078
- Issue date Feb 24, 2015
- Canon Kabushiki Kaisha
- Yohei Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for pre-treating specimen and method for analyzing specimen
- Patent number 8,415,116
- Issue date Apr 9, 2013
- Canon Kabushiki Kaisha
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometry substrate and mass spectrometry method
- Patent number 8,217,340
- Issue date Jul 10, 2012
- Canon Kabushiki Kaisha
- Kimihiro Yoshimura
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method of measuring target object in a sample using mass spectrometry
- Patent number 7,956,321
- Issue date Jun 7, 2011
- Canon Kabushiki Kaisha
- Yohei Murayama
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for obtaining information and device therefor
- Patent number 7,851,749
- Issue date Dec 14, 2010
- Canon Kabushiki Kaisha
- Manabu Komatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information obtaining method
- Patent number 7,795,579
- Issue date Sep 14, 2010
- Canon Kabushiki Kaisha
- Manabu Komatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-sensitivity mass spectrometer and method
- Patent number 7,560,689
- Issue date Jul 14, 2009
- Canon Kabushiki Kaisha
- Kazuhiro Ban
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-plane distribution measurement method
- Patent number 7,446,309
- Issue date Nov 4, 2008
- Canon Kabushiki Kaisha
- Yohei Murayama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING DEVICE TO PROCESS SPECTRAL INFORMATION, AND...
- Publication number 20170322146
- Publication date Nov 9, 2017
- Canon Kabushiki Kaisha
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
PHOTOCURABLE COMPOSITION, METHOD FOR FORMING A PATTERN, AND METHOD...
- Publication number 20170278704
- Publication date Sep 28, 2017
- Canon Kabushiki Kaisha
- Yohei Murayama
- B82 - NANO-TECHNOLOGY
Information Patent Application
SORTING APPARATUS AND GENERATING METHOD OF SORTING SETTING INFORMATION
- Publication number 20160008853
- Publication date Jan 14, 2016
- Kabushiki Kaisha Toshiba
- Yohei Murayama
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...
- Publication number 20150311057
- Publication date Oct 29, 2015
- Canon Kabushiki Kaisha
- Yohei Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS IMAGE ANALYZING SYSTEM
- Publication number 20150155132
- Publication date Jun 4, 2015
- Canon Kabushiki Kaisha
- Naofumi Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTOCURED PRODUCT
- Publication number 20150086755
- Publication date Mar 26, 2015
- Canon Kabushiki Kaisha
- Chieko Mihara
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PHOTOCURED PRODUCT AND METHOD FOR PRODUCING THE SAME
- Publication number 20150004790
- Publication date Jan 1, 2015
- Canon Kabushiki Kaisha
- Yohei Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GROUP IRRADIATION DEVICE AND SECONDARY ION MASS SPECTROMETER
- Publication number 20140374587
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...
- Publication number 20140374585
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...
- Publication number 20140374586
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION ACQUISITION METHOD
- Publication number 20140087408
- Publication date Mar 27, 2014
- Canon Kabushiki Kaisha
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PRE-TREATING SPECIMEN AND METHOD FOR ANALYZING SPECIMEN
- Publication number 20130203105
- Publication date Aug 8, 2013
- Canon Kabushiki Kaisha
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETRY SUBSTRATE AND MASS SPECTROMETRY METHOD
- Publication number 20090266982
- Publication date Oct 29, 2009
- Canon Kabushiki Kaisha
- Kimihiro Yoshimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING TARGET OBJECT IN A SAMPLE USING MASS SPECTROMETRY
- Publication number 20090026364
- Publication date Jan 29, 2009
- Canon Kabushiki Kaisha
- Yohei Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION OBTAINING METHOD
- Publication number 20080290268
- Publication date Nov 27, 2008
- Canon Kabushiki Kaisha
- Manabu Komatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRE-TREATING SPECIMEN AND METHOD FOR ANALYZING SPECIMEN
- Publication number 20080278706
- Publication date Nov 13, 2008
- Canon Kabushiki Kaisha
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBTAINING INFORMATION AND DEVICE THEREFOR
- Publication number 20080179512
- Publication date Jul 31, 2008
- Canon Kabushiki Kaisha
- Manabu Komatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TREATING LIVING SAMPLES AND ANALYZING THE SAME
- Publication number 20080090267
- Publication date Apr 17, 2008
- Canon Kabushiki Kaisha
- Manabu Komatsu
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SENSITIVITY MASS SPECTROMETER AND METHOD
- Publication number 20080073509
- Publication date Mar 27, 2008
- Canon Kabushiki Kaisha
- Kazuhiro Ban
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Biological tissue processing substrate, processing apparatus, proce...
- Publication number 20070105087
- Publication date May 10, 2007
- Canon Kabushiki Kaisha
- Kazuhiro Ban
- G01 - MEASURING TESTING
Information Patent Application
In-plane distribution measurement method
- Publication number 20060118711
- Publication date Jun 8, 2006
- Canon Kabushiki Kaisha
- Yohei Murayama
- H01 - BASIC ELECTRIC ELEMENTS

Yohei Murayama

Person

Patents Grantslast 30 patents

Photocurable composition, method for forming a pattern, and method...

Information processing device to process spectral information, and...

Photocured product and method for producing the same

Mass spectrometer and mass image analyzing system

Method for treating living samples and analyzing the same

Method for pre-treating specimen and method for analyzing specimen

Biological tissue processing substrate for fixing proteins or prote...

Ion group irradiation device and secondary ion mass spectrometer

Method for pre-treating specimen and method for analyzing specimen

Mass spectrometry substrate and mass spectrometry method

Method of measuring target object in a sample using mass spectrometry

Method for obtaining information and device therefor

Information obtaining method

High-sensitivity mass spectrometer and method

In-plane distribution measurement method

Patents Applicationslast 30 patents

INFORMATION PROCESSING DEVICE TO PROCESS SPECTRAL INFORMATION, AND...

PHOTOCURABLE COMPOSITION, METHOD FOR FORMING A PATTERN, AND METHOD...

SORTING APPARATUS AND GENERATING METHOD OF SORTING SETTING INFORMATION

ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...

MASS SPECTROMETER AND MASS IMAGE ANALYZING SYSTEM

PHOTOCURED PRODUCT

PHOTOCURED PRODUCT AND METHOD FOR PRODUCING THE SAME

ION GROUP IRRADIATION DEVICE AND SECONDARY ION MASS SPECTROMETER

ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...

ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...

INFORMATION ACQUISITION METHOD

METHOD FOR PRE-TREATING SPECIMEN AND METHOD FOR ANALYZING SPECIMEN

MASS SPECTROMETRY SUBSTRATE AND MASS SPECTROMETRY METHOD

METHOD OF MEASURING TARGET OBJECT IN A SAMPLE USING MASS SPECTROMETRY

INFORMATION OBTAINING METHOD

METHOD FOR PRE-TREATING SPECIMEN AND METHOD FOR ANALYZING SPECIMEN

METHOD FOR OBTAINING INFORMATION AND DEVICE THEREFOR

METHOD FOR TREATING LIVING SAMPLES AND ANALYZING THE SAME

HIGH-SENSITIVITY MASS SPECTROMETER AND METHOD

Biological tissue processing substrate, processing apparatus, proce...

In-plane distribution measurement method