Yohei Nakamura

Person

Koto-ku, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection method
- Patent number 12,181,513
- Issue date Dec 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Shota Mitsugi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,749,494
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for deriving electrical characteristics and non-transitory c...
- Patent number 11,694,325
- Issue date Jul 4, 2023
- HITACHI HIGH-TECH CORPORATION
- Heita Kimizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,646,172
- Issue date May 9, 2023
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device defect detection method using a charged particle beam
- Patent number 11,631,568
- Issue date Apr 18, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,610,754
- Issue date Mar 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,398,367
- Issue date Jul 26, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,398,366
- Issue date Jul 26, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrasonic diagnostic apparatus and probe used for the same
- Patent number 11,357,476
- Issue date Jun 14, 2022
- FUJIFILM Healthcare Corporation
- Yutaka Igarashi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Charged particle beam device
- Patent number 11,355,308
- Issue date Jun 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,335,535
- Issue date May 17, 2022
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrasonic diagnostic apparatus and probe used for the same
- Patent number 11,284,859
- Issue date Mar 29, 2022
- FUJIFILM Healthcare Corporation
- Yutaka Igarashi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Ultrasonic diagnostic apparatus and probe used for the same
- Patent number 11,191,527
- Issue date Dec 7, 2021
- Hitachi, Ltd.
- Yutaka Igarashi
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Charged particle beam apparatus and charged particle beam inspectio...
- Patent number 11,043,359
- Issue date Jun 22, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring apparatus and method of setting observation condition
- Patent number 11,043,358
- Issue date Jun 22, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryoko Araki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,971,347
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Mitsuhiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrasound probe and ultrasound diagnosis device using the same
- Patent number 10,856,845
- Issue date Dec 8, 2020
- Hitachi, Ltd.
- Yusaku Katsube
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Sensor terminal and sensor system
- Patent number 10,554,217
- Issue date Feb 4, 2020
- Hitachi, Ltd.
- Yohei Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Successive approximation analog-to-digital converter
- Patent number 10,312,932
- Issue date Jun 4, 2019
- Hitachi, Ltd.
- Yohei Nakamura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Interleaved A/D converter
- Patent number 9,337,853
- Issue date May 10, 2016
- Hitachi, Ltd.
- Yohei Nakamura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-to-digital converter and wireless receiver
- Patent number 8,933,831
- Issue date Jan 13, 2015
- Hitachi, Ltd.
- Takashi Oshima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Conductive laminate and touch panel using same
- Patent number 8,715,793
- Issue date May 6, 2014
- Oji Holdings Corporation
- Masayo Maeda
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Conductive laminate and touch panel using same
- Patent number 8,663,755
- Issue date Mar 4, 2014
- Oji Holdings Corporation
- Masayo Maeda
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM
- Publication number 20240151665
- Publication date May 9, 2024
- Hitachi High-Tech Corporation
- Yohei NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Inspection System
- Publication number 20240029994
- Publication date Jan 25, 2024
- Hitachi High-Tech Corporation
- Natsuki TSUNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20230377837
- Publication date Nov 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Yohei NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection Method
- Publication number 20230273254
- Publication date Aug 31, 2023
- Hitachi High-Tech Corporation
- Shota MITSUGI
- G01 - MEASURING TESTING
Information Patent Application
System for Deriving Electrical Characteristics and Non-Transitory C...
- Publication number 20230274417
- Publication date Aug 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Heita KIMIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20230253180
- Publication date Aug 10, 2023
- HITACHI HIGH-TECH CORPORATION
- Daisuke BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE DEFECT DETECTION METHOD USING A CHARGED PARTICLE BEAM
- Publication number 20220108866
- Publication date Apr 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220102108
- Publication date Mar 31, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220102109
- Publication date Mar 31, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220013326
- Publication date Jan 13, 2022
- Hitachi High-Tech Corporation
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20210066028
- Publication date Mar 4, 2021
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210043412
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM INSPECTIO...
- Publication number 20210043419
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for Deriving Electrical Characteristics and Non-Transitory C...
- Publication number 20210042900
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Heita KIMIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210043413
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210043415
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210020422
- Publication date Jan 21, 2021
- Hitachi High-Technologies Corporation
- Mitsuhiro NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING APPARATUS AND METHOD OF SETTING OBSERVATION CONDITION
- Publication number 20200111638
- Publication date Apr 9, 2020
- Hitachi High-Technologies Corporation
- Ryoko ARAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ultrasonic Diagnostic Apparatus and Probe Used for the Same
- Publication number 20200077979
- Publication date Mar 12, 2020
- Hitachi, Ltd
- Yutaka IGARASHI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Ultrasonic Diagnostic Apparatus and Probe Used for the Same
- Publication number 20190328369
- Publication date Oct 31, 2019
- Hitachi, Ltd
- Yutaka IGARASHI
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
SENSOR TERMINAL AND SENSOR SYSTEM
- Publication number 20190199366
- Publication date Jun 27, 2019
- Hitachi, Ltd
- Yohei NAKAMURA
- G08 - SIGNALLING
Information Patent Application
Successive Approximation Analog-To-Digital Converter
- Publication number 20190074845
- Publication date Mar 7, 2019
- Hitachi, Ltd
- Yohei NAKAMURA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ULTRASOUND PROBE AND ULTRASOUND DIAGNOSIS DEVICE USING THE SAME
- Publication number 20180192994
- Publication date Jul 12, 2018
- Hitachi, Ltd
- Yusaku KATSUBE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INTERLEAVED A/D CONVERTER
- Publication number 20150341044
- Publication date Nov 26, 2015
- Hitachi, Ltd.
- Yohei NAKAMURA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CONDUCTIVE LAMINATE AND TOUCH PANEL USING SAME
- Publication number 20130270098
- Publication date Oct 17, 2013
- Masayo Maeda
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
DOUBLE-FACED PRESSURE-SENSITIVE ADHESIVE SHEET, DOUBLE-FACED PRESSU...
- Publication number 20130164478
- Publication date Jun 27, 2013
- OJI HOLDINGS CORPORATION
- Masayuki Yamamoto
- B32 - LAYERED PRODUCTS
Information Patent Application
ANALOG-TO-DIGITAL CONVERTER AND WIRELESS RECEIVER
- Publication number 20130058437
- Publication date Mar 7, 2013
- Hitachi, Ltd.
- Takashi OSHIMA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CONDUCTIVE LAMINATE AND TOUCH PANEL USING SAME
- Publication number 20120298497
- Publication date Nov 29, 2012
- OJI PAPER CO., LTD.
- Masayo Maeda
- G06 - COMPUTING CALCULATING COUNTING

Yohei Nakamura

Person

Patents Grantslast 30 patents

Inspection method

Charged particle beam apparatus

System for deriving electrical characteristics and non-transitory c...

Charged particle beam apparatus

Device defect detection method using a charged particle beam

Charged particle beam device

Charged particle beam apparatus

Charged particle beam apparatus

Ultrasonic diagnostic apparatus and probe used for the same

Charged particle beam device

Charged particle beam apparatus

Ultrasonic diagnostic apparatus and probe used for the same

Ultrasonic diagnostic apparatus and probe used for the same

Charged particle beam apparatus and charged particle beam inspectio...

Measuring apparatus and method of setting observation condition

Charged particle beam apparatus

Ultrasound probe and ultrasound diagnosis device using the same

Sensor terminal and sensor system

Successive approximation analog-to-digital converter

Interleaved A/D converter

Analog-to-digital converter and wireless receiver

Conductive laminate and touch panel using same

Conductive laminate and touch panel using same

Patents Applicationslast 30 patents

INSPECTION SYSTEM

Inspection System

CHARGED PARTICLE BEAM APPARATUS

Inspection Method

System for Deriving Electrical Characteristics and Non-Transitory C...

CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD

DEVICE DEFECT DETECTION METHOD USING A CHARGED PARTICLE BEAM

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM INSPECTIO...

System for Deriving Electrical Characteristics and Non-Transitory C...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

MEASURING APPARATUS AND METHOD OF SETTING OBSERVATION CONDITION

Ultrasonic Diagnostic Apparatus and Probe Used for the Same

Ultrasonic Diagnostic Apparatus and Probe Used for the Same

SENSOR TERMINAL AND SENSOR SYSTEM

Successive Approximation Analog-To-Digital Converter

ULTRASOUND PROBE AND ULTRASOUND DIAGNOSIS DEVICE USING THE SAME

INTERLEAVED A/D CONVERTER

CONDUCTIVE LAMINATE AND TOUCH PANEL USING SAME

DOUBLE-FACED PRESSURE-SENSITIVE ADHESIVE SHEET, DOUBLE-FACED PRESSU...

ANALOG-TO-DIGITAL CONVERTER AND WIRELESS RECEIVER

CONDUCTIVE LAMINATE AND TOUCH PANEL USING SAME