Yohei Okawa

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Waveform observing apparatus and waveform observing system
- Patent number 8,854,398
- Issue date Oct 7, 2014
- Keyence Corporation
- Naoki Goto
- G01 - MEASURING TESTING
Information Patent Grant
Waveform observing apparatus and waveform observing system
- Patent number 8,537,178
- Issue date Sep 17, 2013
- Keyence Corporation
- Naoki Goto
- G01 - MEASURING TESTING
Information Patent Grant
Waveform observing apparatus
- Patent number 8,332,171
- Issue date Dec 11, 2012
- Keyence Corporation
- Takashi Atoro
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Waveform Observing Apparatus and Waveform Observing System
- Publication number 20130328816
- Publication date Dec 12, 2013
- KEYENCE CORPORATION
- Naoki Goto
- G01 - MEASURING TESTING
Information Patent Application
Waveform Observing Apparatus
- Publication number 20100036631
- Publication date Feb 11, 2010
- KEYENCE CORPORATION
- Takashi Atoro
- G01 - MEASURING TESTING
Information Patent Application
Waveform Observing Apparatus and Waveform Observing System
- Publication number 20100026713
- Publication date Feb 4, 2010
- KEYENCE CORPORATION
- Naoki Goto
- G06 - COMPUTING CALCULATING COUNTING