YOHEI TAKECHI

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Laser processing apparatus, laser processing method, and correction...
- Patent number 11,975,403
- Issue date May 7, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yohei Takechi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Laser processing apparatus and laser processing method
- Patent number 11,969,823
- Issue date Apr 30, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Jun Yokoyama
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Laser processing apparatus and optical adjustment method
- Patent number 11,648,624
- Issue date May 16, 2023
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Jun Yokoyama
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Laser processing apparatus, laser processing method, and correction...
- Patent number 11,648,629
- Issue date May 16, 2023
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yohei Takechi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
OCT measuring device and oct measuring method
- Patent number 11,408,722
- Issue date Aug 9, 2022
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yohei Takechi
- G01 - MEASURING TESTING
Information Patent Grant
Inner layer measurement method and inner layer measurement device
- Patent number 9,977,229
- Issue date May 22, 2018
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Hirotoshi Oikaze
- G02 - OPTICS
Information Patent Grant
Protective member and method for using protective member
- Patent number 9,500,861
- Issue date Nov 22, 2016
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yohei Takechi
- G02 - OPTICS
Information Patent Grant
Quality evaluation method and quality evaluation apparatus
- Patent number 8,885,848
- Issue date Nov 11, 2014
- Panasonic Corporation
- Yohei Takechi
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Refractive index measuring apparatus
- Patent number 8,593,624
- Issue date Nov 26, 2013
- Panasonic Corporation
- Yusuke Kusaka
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic stress measurement method and device
- Patent number 8,181,524
- Issue date May 22, 2012
- Panasonic Corporation
- Nobuo Hara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MODULE ADJUSTMENT METHOD AND EXAMINATION METHOD
- Publication number 20250035508
- Publication date Jan 30, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- JUN YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
LASER PROCESSING APPARATUS AND LASER PROCESSING METHOD
- Publication number 20240416453
- Publication date Dec 19, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Jun YOKOYAMA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER PROCESSING APPARATUS, LASER PROCESSING METHOD, AND CORRECTION...
- Publication number 20240227072
- Publication date Jul 11, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Yohei TAKECHI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER PROCESSING APPARATUS AND LASER PROCESSING METHOD
- Publication number 20240227074
- Publication date Jul 11, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Jun YOKOYAMA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER PROCESSING APPARATUS AND LASER PROCESSING METHOD
- Publication number 20220055147
- Publication date Feb 24, 2022
- Panasonic Intellectual Property Management Co., Ltd.
- JUN YOKOYAMA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OCT MEASURING DEVICE AND OCT MEASURING METHOD
- Publication number 20210381818
- Publication date Dec 9, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- YOHEI TAKECHI
- G01 - MEASURING TESTING
Information Patent Application
LASER PROCESSING APPARATUS AND LASER PROCESSING METHOD
- Publication number 20210323088
- Publication date Oct 21, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- Jun YOKOYAMA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER PROCESSING APPARATUS AND OPTICAL ADJUSTMENT METHOD
- Publication number 20210060695
- Publication date Mar 4, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- Jun Yokoyama
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER PROCESSING APPARATUS, LASER PROCESSING METHOD, AND CORRECTION...
- Publication number 20210053149
- Publication date Feb 25, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- Yohei TAKECHI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER PROCESSING APPARATUS, LASER PROCESSING METHOD, AND CORRECTION...
- Publication number 20200361038
- Publication date Nov 19, 2020
- Panasonic Intellectual Property Management Co., Ltd.
- YOHEI TAKECHI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROTECTIVE MEMBER
- Publication number 20160259162
- Publication date Sep 8, 2016
- Panasonic Intellectual Property Management Co., Ltd.
- YOHEI TAKECHI
- G02 - OPTICS
Information Patent Application
BIOLOGICAL MEASUREMENT DEVICE AND BIOLOGICAL MEASUREMENT METHOD
- Publication number 20160143589
- Publication date May 26, 2016
- Panasonic Intellectual Property Management Co., Ltd.
- YASUHIRO KABETANI
- G01 - MEASURING TESTING
Information Patent Application
INNER LAYER MEASUREMENT METHOD AND INNER LAYER MEASUREMENT DEVICE
- Publication number 20160097921
- Publication date Apr 7, 2016
- Panasonic Intellectual Property Management Co., Ltd.
- HIROTOSHI OIKAZE
- G02 - OPTICS
Information Patent Application
QUALITY EVALUATION METHOD AND QUALITY EVALUATION APPARATUS
- Publication number 20110282654
- Publication date Nov 17, 2011
- Yohei TAKECHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REFRACTIVE INDEX MEASURING APPARATUS
- Publication number 20110051127
- Publication date Mar 3, 2011
- PANASONIC CORPORATION
- Yusuke Kusaka
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC STRESS MEASUREMENT METHOD AND DEVICE
- Publication number 20100162817
- Publication date Jul 1, 2010
- Nobuo HARA
- G01 - MEASURING TESTING

YOHEI TAKECHI

Person

Patents Grantslast 30 patents

Laser processing apparatus, laser processing method, and correction...

Laser processing apparatus and laser processing method

Laser processing apparatus and optical adjustment method

Laser processing apparatus, laser processing method, and correction...

OCT measuring device and oct measuring method

Inner layer measurement method and inner layer measurement device

Protective member and method for using protective member

Quality evaluation method and quality evaluation apparatus

Refractive index measuring apparatus

Ultrasonic stress measurement method and device

Patents Applicationslast 30 patents

OPTICAL MODULE ADJUSTMENT METHOD AND EXAMINATION METHOD

LASER PROCESSING APPARATUS AND LASER PROCESSING METHOD

LASER PROCESSING APPARATUS, LASER PROCESSING METHOD, AND CORRECTION...

LASER PROCESSING APPARATUS AND LASER PROCESSING METHOD

LASER PROCESSING APPARATUS AND LASER PROCESSING METHOD

OCT MEASURING DEVICE AND OCT MEASURING METHOD

LASER PROCESSING APPARATUS AND LASER PROCESSING METHOD

LASER PROCESSING APPARATUS AND OPTICAL ADJUSTMENT METHOD

LASER PROCESSING APPARATUS, LASER PROCESSING METHOD, AND CORRECTION...

LASER PROCESSING APPARATUS, LASER PROCESSING METHOD, AND CORRECTION...

PROTECTIVE MEMBER

BIOLOGICAL MEASUREMENT DEVICE AND BIOLOGICAL MEASUREMENT METHOD

INNER LAYER MEASUREMENT METHOD AND INNER LAYER MEASUREMENT DEVICE

QUALITY EVALUATION METHOD AND QUALITY EVALUATION APPARATUS

REFRACTIVE INDEX MEASURING APPARATUS

ULTRASONIC STRESS MEASUREMENT METHOD AND DEVICE