Yohji Mashiko

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
System for analyzing a failure in a semiconductor wafer by calculat...
- Patent number 6,009,545
- Issue date Dec 28, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Toshikazu Tsutsui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for analyzing a failure in a semiconductor wafer and meth...
- Patent number 5,844,850
- Issue date Dec 1, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Toshikazu Tsutsui
- G06 - COMPUTING CALCULATING COUNTING