Yoichi Fujisawa

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Silicon substrate evaluation method and semiconductor device manufa...
- Patent number 6,187,600
- Issue date Feb 13, 2001
- Fujitsu Limited
- Yoichi Fujisawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor devices using an intermediate g...
- Patent number 5,426,073
- Issue date Jun 20, 1995
- Fujitsu Limited
- Kazunori Imaoka
- B24 - GRINDING POLISHING