Yoichi Funatoko

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Tokyo, JP

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Patents Applicationslast 30 patents

Information Patent Application
PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PR...
- Publication number 20250020689
- Publication date Jan 16, 2025
- FormFactor, Inc.
- Choon Beng Sia
- G01 - MEASURING TESTING
Information Patent Application
CUSTOMIZABLE PROBE CARDS, PROBE SYSTEMS INCLUDING THE SAME, AND REL...
- Publication number 20210172978
- Publication date Jun 10, 2021
- FormFactor Beaverton, Inc.
- Yoichi Funatoko
- G01 - MEASURING TESTING