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Yoichi Hiruta
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Yokohama, JP
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last 30 patents
Information
Patent Grant
Reel tape for provisionally supporting a bare chip
Patent number
6,182,828
Issue date
Feb 6, 2001
Kabushiki Kaisha Toshiba
Yoichi Hiruta
G01 - MEASURING TESTING
Information
Patent Grant
Flip-chip connection type semiconductor integrated circuit device
Patent number
6,111,317
Issue date
Aug 29, 2000
Kabushiki Kaisha Toshiba
Takashi Okada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Board for evaluating the characteristics of a semiconductor chip an...
Patent number
6,094,057
Issue date
Jul 25, 2000
Kabushiki Kaisha Toshiba
Yoichi Hiruta
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device having ball grid array
Patent number
5,998,861
Issue date
Dec 7, 1999
Kabushiki Kaisha Toshiba
Yoichi Hiruta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Bare chip prober device
Patent number
5,952,841
Issue date
Sep 14, 1999
Kabushiki Kaisha Toshiba
Yoichi Hiruta
G01 - MEASURING TESTING
Information
Patent Grant
Flip chip mounting type semiconductor device
Patent number
5,801,447
Issue date
Sep 1, 1998
Kabushiki Kaisha Toshiba
Naohiko Hirano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Connecting electrode portion in semiconductor device
Patent number
5,648,686
Issue date
Jul 15, 1997
Kabushiki Kaisha Toshiba
Naohiko Hirano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Flip-chip semiconductor devices having two encapsulants
Patent number
5,629,566
Issue date
May 13, 1997
Kabushiki Kaisha Toshiba
Kazuhide Doi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing a semiconductor device
Patent number
5,533,664
Issue date
Jul 9, 1996
Kabushiki Kaisha Toshiba
Mamoru Sasaki
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Power source noise suppressing type semiconductor device
Patent number
5,477,079
Issue date
Dec 19, 1995
Kabushiki Kaisha Toshiba
Yoichi Hiruta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor integrated circuit device having sealing means
Patent number
5,463,245
Issue date
Oct 31, 1995
Kabushiki Kaisha Toshiba
Yoichi Hiruta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic device having a chip with an external bump terminal equa...
Patent number
5,461,197
Issue date
Oct 24, 1995
Kabushiki Kaisha Toshiba
Yoichi Hiruta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method for mounting semiconductor wafer
Patent number
5,424,917
Issue date
Jun 13, 1995
Kabushiki Kaisha Toshiba
Yoichi Hiruta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device of multichip module-type
Patent number
5,401,688
Issue date
Mar 28, 1995
Kabushiki Kaisha Toshiba
Yasuhiro Yamaji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and manufacturing method thereof
Patent number
5,179,434
Issue date
Jan 12, 1993
Kabushiki Kaisha Toshiba
Yoichi Hiruta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-chip package type semiconductor device
Patent number
5,138,433
Issue date
Aug 11, 1992
Kabushiki Kaisha Toshiba
Yoichi Hiruta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing MOS transistor by dual species implantation...
Patent number
4,764,478
Issue date
Aug 16, 1988
Kabushiki Kaisha Toshiba
Yoichi Hiruta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Manufacturing MOS semiconductor device with planarized conductive l...
Patent number
4,713,356
Issue date
Dec 15, 1987
Kabushiki Kaisha Toshiba
Yoichi Hiruta
H01 - BASIC ELECTRIC ELEMENTS